NIIN Output Data
NIIN:
NSN:
Item Name:
TRANSISTOR
Definition:
AN ACTIVE SEMICONDUCTOR DEVICE WITH THREE OR MORE ELECTRODES. MAY OR MAY NOT INCLUDE MOUNTING HARDWARE AND/OR HEATSINK. EXCLUDES SEMICONDUCTOR DEVICE, DIODE AND SEMICONDUCTOR DEVICE, THYRISTOR. FOR SOLID STATE DEVICES WHICH ARE RESPONSIVE TO VISIBLE OR INFRARED RADIANT ENERGY, SEE SEMICONDUCTOR DEVICE, PHOTO.
Reference/Part Number
| Part Number | CAGE | Status | RNCC | RNVC | DAC | RNAAC | MSDS | SADC |
|---|---|---|---|---|---|---|---|---|
| 352250020082 | H0203 | A | 5 | 2 | 5 | ZZ | ||
| MIL-S-19500/464 | 81349 | M | 5 | 9 | 4 | ZZ | ||
| JAN2N5686 | C7191 | A | 5 | 2 | 5 | ZZ | ||
| MIL-PRF-19500/464 | 81349 | M | 4 | 1 | 4 | ZZ | ||
| JAN2N5686 | 81349 | M | 2 | 2 | 4 | ZZ | ||
| 123653-01 | 97525 | A | C | 1 | 5 | ZZ | AF |
CAGE Information
| Code | Company |
|---|---|
| 81349 | MILITARY SPECIFICATIONS PROMULGATED |
| H0203 | THALES NEDERLAND |
| C7191 | ADELCO ELEKTRONIK GMBH |
| 97525 | TRANSICO INC. DBA EECO SWITCH |
Characteristics (Decoded)
| MRC | Requirements Statement | Clear Text Reply |
|---|---|---|
| TEST | TEST DATA DOCUMENT | 81349-MIL-S-19500 SPECIFICATION |
| TEST | TEST DATA DOCUMENT | 81349-MIL-S-19500 SPECIFICATION |
| FEAT | SPECIAL FEATURES | JUNCTION PATTERN ARRANGEMENT: NPN |
| ABBH | INCLOSURE MATERIAL | METAL |
| ALAS | INTERNAL CONFIGURATION | JUNCTION CONTACT |
| CTMZ | SEMICONDUCTOR MATERIAL | SILICON |
| CBBL | FEATURES PROVIDED | HERMETICALLY SEALED CASE |
| ZZZK | SPECIFICATION/STANDARD DATA | 81349-MIL-S-19500/464 GOVERNMENT SPECIFICATION |
| ALBA | ELECTRODE INTERNALLY-ELECTRICALLY CONNECTED TO CASE | COLLECTOR |
| AKPV | MOUNTING FACILITY QUANTITY | 1 |
| AXGY | MOUNTING METHOD | UNTHREADED HOLE |
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JAN2N5686 ,
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,
352250020082 ,
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JAN2N5686 ,
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123653-01 ,