NIIN Output Data
NIIN:
NSN:
Item Name:
MICROCIRCUIT , LINEAR
Definition:
A MICROCIRCUIT WHOSE OUTPUT IS A FUNCTION OF THE INPUT; THAT IS, THE OUTPUT VARIES IN A PREDETERMINED AND ESSENTIALLY PREDICTABLE MANNER FROM THE INPUT SIGNAL.
Reference/Part Number
Part Number | CAGE | Status | RNCC | RNVC | DAC | RNAAC | MSDS | SADC |
---|---|---|---|---|---|---|---|---|
SE527K/883B | 18324 | A | 5 | 9 | 5 | TX | ||
1757-0896 | 08241 | H | 3 | 9 | 5 | 48 | ||
RB527K | 18324 | A | C | 1 | 5 | 48 | ||
SE527H/883B | 18324 | A | 5 | 2 | E | TX |
CAGE Information
Code | Company |
---|---|
08241 | LOCKHEED MARTIN CORP LOCKHEED MARTIN |
18324 | PHILIPS SEMICONDUCTORS INC |
Federal Supply Class
Title
MICROCIRCUITS, ELECTRONIC
Inclusions:
INCLUDES INTEGRATED CIRCUIT DEVICES; INTEGRATED CIRCUIT MODULES, INTEGRATED ELECTRONIC DEVICES: HYBRID, MAGNETIC, MOLECULAR, OPTO-ELECTRONIC, AND THIN FILM.
Exclusions:
EXCLUDES SINGLE CIRCUIT ELEMENTS SUCH AS CAPACITORS; RESISTORS; DIODES AND TRANSISTORS; PRINTED CIRCUIT BOARDS AND CIRCUIT CARD ASSEMBLIES; AND FILTERS AND NETWORKS.
Characteristics (Decoded)
MRC | Requirements Statement | Clear Text Reply |
---|---|---|
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
TEST | TEST DATA DOCUMENT | 81349-MIL-STD-883 LEVEL B STANDARD |
CQSJ | INCLOSURE MATERIAL | GLASS AND METAL |
CWSG | TERMINAL SURFACE TREATMENT | GOLD |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
AEHX | MAXIMUM POWER DISSIPATION RATING | 600.0 MILLIWATTS |
CSSL | DESIGN FUNCTION AND QUANTITY | 1 COMPARATOR, VOLTAGE |
ADAR | BODY OUTSIDE DIAMETER | 0.370 INCHES NOMINAL |
CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | T0-100 JOINT ELECTRON DEVICE ENGINEERING COUNCIL |
CQZP | INPUT CIRCUIT PATTERN | 6 INPUT |
ADAQ | BODY LENGTH | 0.185 INCHES NOMINAL |
CQSZ | INCLOSURE CONFIGURATION | CAN |
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SE527K/883B ,
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