NIIN Output Data
NIIN:
NSN:
Item Name:
MICROCIRCUIT , DIGITAL
Definition:
A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".
Reference/Part Number
Part Number | CAGE | Status | RNCC | RNVC | DAC | RNAAC | MSDS | SADC |
---|---|---|---|---|---|---|---|---|
SM-A-858308-2 | 80063 | A | 3 | 2 | 2 | 9Z |
CAGE Information
Code | Company |
---|---|
80063 | US ARMY COMMUNICATIONS & ELECTRONICS |
Characteristics (Decoded)
MRC | Requirements Statement | Clear Text Reply |
---|---|---|
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
CQSJ | INCLOSURE MATERIAL | CERAMIC OR GLASS OR METAL |
CSSL | DESIGN FUNCTION AND QUANTITY | 1 GATE, NOR |
ADAQ | BODY LENGTH | 0.375 INCHES MAXIMUM |
CQSZ | INCLOSURE CONFIGURATION | FLAT PACK |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
CQZP | INPUT CIRCUIT PATTERN | TRIPLE 3 INPUT |
ADAT | BODY WIDTH | 0.250 INCHES NOMINAL |
FEAT | SPECIAL FEATURES | SILICON UNIT |
CBBL | FEATURES PROVIDED | MONOLITHIC AND HERMETICALLY SEALED |
CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD |
CZEQ | TIME RATING PER CHACTERISTIC | 15.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 15.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |