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NIIN Output Data

NIIN:
NSN:
Item Name:
MICROCIRCUIT , DIGITAL

Definition:

A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".

Reference/Part Number

Part Number CAGE Status RNCC RNVC DAC RNAAC MSDS SADC
722912-3 05869 A 3 2 5 TX
ROM/PROM 16236 A 5 1 5 TX
CC175F 18324 A 5 2 5 TX
82S131A/BEA 18324 A 5 2 5 TX
S82S131F883C 18324 A 5 9 5 TX

CAGE Information

Code Company
05869 RAYTHEON COMPANY DBA RAYTHEON
16236 DLA LAND AND MARITIME
18324 PHILIPS SEMICONDUCTORS INC

Characteristics (Decoded)

MRC Requirements Statement Clear Text Reply
CBBL FEATURES PROVIDED 3-STATE OUTPUT AND BIPOLAR AND PROGRAMMABLE AND W/ENABLE AND SCHOTTKY
CQSZ INCLOSURE CONFIGURATION DUAL-IN-LINE
AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS
CZEQ TIME RATING PER CHACTERISTIC 70.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 70.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT
ADAU BODY HEIGHT 0.145 INCHES MINIMUM AND 0.175 INCHES MAXIMUM
CRHL BIT QUANTITY (NON-CORE) 2048
ADAQ BODY LENGTH 0.755 INCHES MINIMUM AND 0.785 INCHES MAXIMUM
AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS
ADAT BODY WIDTH 0.302 INCHES MAXIMUM
CQSJ INCLOSURE MATERIAL CERAMIC AND GLASS
CQWX OUTPUT LOGIC FORM TRANSISTOR-TRANSISTOR LOGIC
TEST TEST DATA DOCUMENT 96906-MIL-STD-883 STANDARD
CSWJ WORD QUANTITY (NON-CORE) 512
CQZP INPUT CIRCUIT PATTERN 10 INPUT

Similar Parts

722912-3 , 7229123 , 5962-01-129-2921 , 5962011292921 , 011292921 , 722912-3 , ROM/PROM , CC175F , 82S131A/BEA , S82S131F883C ,