NIIN Output Data
NIIN:
NSN:
Item Name:
MICROCIRCUIT , DIGITAL
Definition:
A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".
Reference/Part Number
| Part Number | CAGE | Status | RNCC | RNVC | DAC | RNAAC | MSDS | SADC |
|---|---|---|---|---|---|---|---|---|
| N82S181F-SB | 18324 | A | 5 | 2 | 5 | 9Z | ||
| 6381-J | 50364 | F | 5 | 9 | 5 | 9Z | ||
| SN74S478JP4 | 01295 | A | 3 | 2 | 5 | 9Z | ||
| 63A133588P92 | 16331 | A | 7 | 2 | 2 | 9Z | ||
| 93451DCQR | 07263 | A | 5 | 9 | 5 | 9Z |
CAGE Information
| Code | Company |
|---|---|
| 01295 | TEXAS INSTRUMENTS INCORPORATED DBA T |
| 18324 | PHILIPS SEMICONDUCTORS INC |
| 50364 | MMI/AMD |
| 16331 | LOCKHEED MARTIN CORPORATION DBA LOCK |
| 07263 | FAIRCHILD SEMICONDUCTOR CORP |
Characteristics (Decoded)
| MRC | Requirements Statement | Clear Text Reply |
|---|---|---|
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| CBBL | FEATURES PROVIDED | BURN IN |
| TEST | TEST DATA DOCUMENT | 16331-63A133588 DRAWING |
| AFGA | OPERATING TEMP RANGE | +0.0/+70.0 DEG CELSIUS |
| CQSJ | INCLOSURE MATERIAL | CERAMIC |
| CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
Similar Parts
SN74S478JP4 ,
SN74S478JP4 ,
5962-01-248-0235 ,
5962012480235 ,
012480235
,
N82S181F-SB ,
6381-J ,
SN74S478JP4 ,
63A133588P92 ,
93451DCQR ,