NIIN Output Data
NIIN:
NSN:
Item Name:
MICROCIRCUIT , DIGITAL
Definition:
A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".
Reference/Part Number
Part Number | CAGE | Status | RNCC | RNVC | DAC | RNAAC | MSDS | SADC |
---|---|---|---|---|---|---|---|---|
IMS1620S-70M | 60911 | F | 5 | 9 | E | TX | ||
IDT7188S85CB | 61772 | A | 5 | 2 | E | TX | ||
10116252-101 | 94580 | A | 3 | 2 | A | TX |
CAGE Information
Code | Company |
---|---|
60911 | SGS-THOMSON MICROELECTRONICS INC |
61772 | INTEGRATED DEVICE TECHNOLOGY INC |
94580 | HONEYWELL INTERNATIONAL INC DBA HONE |
Federal Supply Class
Title
MICROCIRCUITS, ELECTRONIC
Inclusions:
INCLUDES INTEGRATED CIRCUIT DEVICES; INTEGRATED CIRCUIT MODULES, INTEGRATED ELECTRONIC DEVICES: HYBRID, MAGNETIC, MOLECULAR, OPTO-ELECTRONIC, AND THIN FILM.
Exclusions:
EXCLUDES SINGLE CIRCUIT ELEMENTS SUCH AS CAPACITORS; RESISTORS; DIODES AND TRANSISTORS; PRINTED CIRCUIT BOARDS AND CIRCUIT CARD ASSEMBLIES; AND FILTERS AND NETWORKS.
Characteristics (Decoded)
MRC | Requirements Statement | Clear Text Reply |
---|---|---|
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
ADAU | BODY HEIGHT | 0.080 INCHES MINIMUM AND 0.140 INCHES MAXIMUM |
ADAT | BODY WIDTH | 0.260 INCHES MINIMUM AND 0.325 INCHES MAXIMUM |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -0.5 VOLTS MINIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE |
ADAQ | BODY LENGTH | 1.050 INCHES MINIMUM AND 1.113 INCHES MAXIMUM |
AEHX | MAXIMUM POWER DISSIPATION RATING | 1000.0 MILLIWATTS |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
TTQY | TERMINAL TYPE AND QUANTITY | 22 PRINTED CIRCUIT |
CBBL | FEATURES PROVIDED | W/ENABLE AND MONOLITHIC AND STATIC OPERATION |
CSWJ | WORD QUANTITY (NON-CORE) | 16384 |
CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD |
CRHL | BIT QUANTITY (NON-CORE) | 65536 |
CQZP | INPUT CIRCUIT PATTERN | 20 INPUT |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |