NIIN Output Data
NIIN:
NSN:
Item Name:
MICROCIRCUIT , MEMORY
Definition:
A CIRCUIT DESIGNED TO STORE INFORMATION AND/OR CODED INSTRUCTIONS FOR LATER USE. ITEM HAS PINS OR OTHER CONNECTIONS TO INSTALL IN A COMPUTER OR COMPUTING DEVICE. DOES NOT INCLUDE MAGNETIC DRUMS, TAPES, PUNCHED CARDS OR THE LIKE. FOR ITEMS THAT HAVE PORTABLE TYPE CONNECTIONS SEE MEMORY, PORTABLE, SOLID STATE.
Reference/Part Number
Part Number | CAGE | Status | RNCC | RNVC | DAC | RNAAC | MSDS | SADC |
---|---|---|---|---|---|---|---|---|
R29653ADM/883B | 49956 | A | 5 | 9 | E | TX | ||
R29653ADM/883B | 3B150 | A | 3 | 2 | E | TX | ||
29653ADM/883B | 49956 | A | 5 | 9 | E | ZZ | ||
29653ADM/883B | 3B150 | A | 5 | 2 | E | ZZ | ||
ROM/PROM HEAD 188 | 16236 | A | 5 | 1 | 6 | TX |
CAGE Information
Code | Company |
---|---|
16236 | DLA LAND AND MARITIME |
49956 | RAYTHEON COMPANY DBA RAYTHEON |
3B150 | RAYTHEON TECHNICAL SERVICES COMPANY |
Federal Supply Class
Title
MICROCIRCUITS, ELECTRONIC
Inclusions:
INCLUDES INTEGRATED CIRCUIT DEVICES; INTEGRATED CIRCUIT MODULES, INTEGRATED ELECTRONIC DEVICES: HYBRID, MAGNETIC, MOLECULAR, OPTO-ELECTRONIC, AND THIN FILM.
Exclusions:
EXCLUDES SINGLE CIRCUIT ELEMENTS SUCH AS CAPACITORS; RESISTORS; DIODES AND TRANSISTORS; PRINTED CIRCUIT BOARDS AND CIRCUIT CARD ASSEMBLIES; AND FILTERS AND NETWORKS.
Characteristics (Decoded)
MRC | Requirements Statement | Clear Text Reply |
---|---|---|
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
ADAT | BODY WIDTH | 0.325 INCHES MAXIMUM |
CQZP | INPUT CIRCUIT PATTERN | 11 INPUT |
AEHX | MAXIMUM POWER DISSIPATION RATING | 1.3 WATTS |
CRHL | BIT QUANTITY (NON-CORE) | 8192 |
ADAQ | BODY LENGTH | 1.000 INCHES MAXIMUM |
CZEQ | TIME RATING PER CHACTERISTIC | 65.00 NANOSECONDS MAXIMUM ACCESS |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
ADAU | BODY HEIGHT | 0.276 INCHES MAXIMUM |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 7.0 VOLTS MAXIMUM POWER SOURCE |
CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
CZER | MEMORY DEVICE TYPE | PROM |
CBBL | FEATURES PROVIDED | PROGRAMMABLE AND HERMETICALLY SEALED AND BURN IN AND TESTED TO MIL-STD-883 AND MONOLITHIC |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD |
CSWJ | WORD QUANTITY (NON-CORE) | 2048 |
TTQY | TERMINAL TYPE AND QUANTITY | 18 PRINTED CIRCUIT |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |