NIIN Output Data
NIIN:
NSN:
Item Name:
SEMICONDUCTOR DEVICE , DIODE
Definition:
A TWO ELECTRODE SEMICONDUCTOR DEVICE HAVING AN ASYMMETRICAL VOLTAGE - CURRENT CHARACTERISTIC. MAY OR MAY NOT INCLUDE MOUNTING HARDWARE AND/OR HEATSINK. EXCLUDES LIGHT EMITTING DIODE AND SEMICONDUCTOR DEVICE,PHOTO. FOR ITEMS CONTAINING MATERIAL SUCH AS SELENIUM AND COPPER OXIDE, SEE RECIFIER, METALLIC.
Reference/Part Number
| Part Number | CAGE | Status | RNCC | RNVC | DAC | RNAAC | MSDS | SADC |
|---|---|---|---|---|---|---|---|---|
| MTV4030-14-85 | 0EFF4 | R | 5 | 9 | 4 | 9Z | ||
| VA-70-0577-014 | K0668 | A | 5 | 2 | 2 | ZK | ||
| MTV4030-14-85 | 3BBY6 | A | 3 | 2 | 5 | ZZ |
CAGE Information
| Code | Company |
|---|---|
| 0EFF4 | MICROMETRICS INC |
| K0668 | SELEX GALILEO LTD DBA SELEX S & A S |
| 3BBY6 | SEMI-GENERAL INC. |
Characteristics (Decoded)
| MRC | Requirements Statement | Clear Text Reply |
|---|---|---|
| AGAV | END ITEM IDENTIFICATION | ARI 23338 |
| FEAT | SPECIAL FEATURES | MANUFACTURER NOMENCLATURE TUNING VARACTOR; SILICON ABRUPT JUNCTION DEVICES OFFER HIGHEST Q AND LOWEST RESISTANCE AVAILABLE IN 30 VOLT TUNING DIODES; SILICON DIOXIDE PASSIVATION PROCESS ASSURES GREATER STABILITY, RELIABILITY AND LOW LEAKAGE CURRENTS AT HIGHER TEMPERATURES; USED FOR NARROW AND WIDE BAND TUNING THROUGH X-BAND; OPERATING TEMPERATURE -55 TO +150 DEGREES C |