Follow Us on Google+

Request A Price Quote:

NIIN Output Data

NIIN:
NSN:
Item Name:
TEST SET , SEMICONDUCTOR DEVICE

Definition:

A TEST SET SPECIFICALLY DESIGNED FOR USE IN MAKING EXAMINATIONS OF DIODES, TRANSISTORS, AND THE LIKE. THESE EXAMINATIONS MAY BE EFFECTED IN OR OUT OF CIRCUIT OR BOTH.

Reference/Part Number

Part Number CAGE Status RNCC RNVC DAC RNAAC MSDS SADC
PD02LEEC44 98752 A 3 2 4 ZZ

CAGE Information

Code Company
98752 WARNER ROBINS AIR LOGISTICS CENTER

Federal Supply Class

Title

ELECTRICAL AND ELECTRONIC PROPER

Inclusions:

INCLUDES TEST LEADS AND TEST LEAD ATTACHMENTS; TEST INSTRUMENTS DESIGNED FOR COMMUNICATION EQUIPMENT; TEST INSTRUMENTS DESIGNED FOR USE WITH ELECTRONIC EQUIPMENT CLASSIFIED IN TWO OR MORE FSC GROUPS.

Exclusions:

EXCLUDES RADIAC EQUIPMENT

Characteristics (Decoded)

MRC Requirements Statement Clear Text Reply
ACZB FREQUENCY RATING 50.0 HERTZ MINIMUM AND 400.0 HERTZ MAXIMUM
ACYN AC VOLTAGE RATING 100.0 VOLTS NOMINAL AND 115.0 VOLTS NOMINAL AND 230.0 VOLTS NOMINAL
AQXY TEST TYPE FOR WHICH DESIGNED TROUBLESHOOTING
AKWC ELECTRICAL POWER SOURCE RELATIONSHIP OPERATING
FEAT SPECIAL FEATURES SUPPLIED ACCESSORIES WILL BE:ONE PAIR OF MICROPROBES,COMMON TEST LEADS,TWO MINI-CLIP LEADS,POWER CORD
ANPZ INCLOSURE FEATURE MULTIPLE ITEM W/CARRYING CASE
FAAZ PHASE SINGLE

Similar Parts

PD02LEEC44 , PD02LEEC44 , 6625-01-500-3007 , 6625015003007 , 015003007 , PD02LEEC44 ,