NIIN Output Data
NIIN:
NSN:
Item Name:
TEST SET , SEMICONDUCTOR DEVICE
Definition:
A TEST SET SPECIFICALLY DESIGNED FOR USE IN MAKING EXAMINATIONS OF DIODES, TRANSISTORS, AND THE LIKE. THESE EXAMINATIONS MAY BE EFFECTED IN OR OUT OF CIRCUIT OR BOTH.
Reference/Part Number
| Part Number | CAGE | Status | RNCC | RNVC | DAC | RNAAC | MSDS | SADC |
|---|---|---|---|---|---|---|---|---|
| PROTRACK SCANNER I | 57705 | A | 3 | 2 | E | 9Z |
CAGE Information
| Code | Company |
|---|---|
| 57705 | HUNTRON INC DBA HUNTRON INSTRUMENTS |
Characteristics (Decoded)
| MRC | Requirements Statement | Clear Text Reply |
|---|---|---|
| ABGL | WIDTH | 11.600 INCHES NOMINAL |
| ANPZ | INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| HGTH | HEIGHT | 4.500 INCHES NOMINAL |
| AQXY | TEST TYPE FOR WHICH DESIGNED | TROUBLESHOOTING |
| AEJZ | DEPTH | 15.000 INCHES NOMINAL |
| CXCY | PART NAME ASSIGNED BY CONTROLLING AGENCY | PROTRACK I |