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Part Number

Part Number:
NSN:
NIIN:
Item Name:
MICROCIRCUIT , DIGITAL

Definition:

A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".

CAGE Information

Code Company
55009 STELLAR MICROELECTRONICS INC.

Federal Supply Class

Title

MICROCIRCUITS, ELECTRONIC

Inclusions:

INCLUDES INTEGRATED CIRCUIT DEVICES; INTEGRATED CIRCUIT MODULES, INTEGRATED ELECTRONIC DEVICES: HYBRID, MAGNETIC, MOLECULAR, OPTO-ELECTRONIC, AND THIN FILM.

Exclusions:

EXCLUDES SINGLE CIRCUIT ELEMENTS SUCH AS CAPACITORS; RESISTORS; DIODES AND TRANSISTORS; PRINTED CIRCUIT BOARDS AND CIRCUIT CARD ASSEMBLIES; AND FILTERS AND NETWORKS.

Characteristics (Decoded)

MRC Requirements Statement Clear Text Reply
AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS
NHCF NUCLEAR HARDNESS CRITICAL FEATURE HARDENED
FEAT SPECIAL FEATURES NUCLEAR HARDNESS CRITICAL ITEMS
AEHX MAXIMUM POWER DISSIPATION RATING 500.0 MILLIWATTS
AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS
CSSL DESIGN FUNCTION AND QUANTITY 1 GATE, OR-NOR
ADAQ BODY LENGTH 0.360 INCHES MAXIMUM
CQSJ INCLOSURE MATERIAL CERAMIC
CZEN VOLTAGE RATING AND TYPE PER CHARACTERISTIC 7.0 VOLTS MAXIMUM POWER SOURCE
ADAT BODY WIDTH 0.360 INCHES MAXIMUM
ADAU BODY HEIGHT 0.100 INCHES MAXIMUM
CQWX OUTPUT LOGIC FORM COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC
TEST TEST DATA DOCUMENT 96906-MIL-STD-883 STANDARD
CQZP INPUT CIRCUIT PATTERN 8 INPUT
CQSZ INCLOSURE CONFIGURATION LEADLESS FLAT PACK
TTQY TERMINAL TYPE AND QUANTITY 20 LEADLESS
CWSG TERMINAL SURFACE TREATMENT SOLDER
CBBL FEATURES PROVIDED MONOLITHIC

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