Part Number
Part Number:
NSN:
NIIN:
Item Name:
MICROCIRCUIT , DIGITAL-LINEAR
Definition:
A MICROCIRCUIT HAVING THE DUAL FUNCTIONS OF A MICROCIRCUIT (1), DIGITAL AND A MICROCIRCUIT (1), LINEAR.
CAGE Information
Code | Company |
---|---|
96214 | RAYTHEON COMPANY |
Federal Supply Class
Title
MICROCIRCUITS, ELECTRONIC
Inclusions:
INCLUDES INTEGRATED CIRCUIT DEVICES; INTEGRATED CIRCUIT MODULES, INTEGRATED ELECTRONIC DEVICES: HYBRID, MAGNETIC, MOLECULAR, OPTO-ELECTRONIC, AND THIN FILM.
Exclusions:
EXCLUDES SINGLE CIRCUIT ELEMENTS SUCH AS CAPACITORS; RESISTORS; DIODES AND TRANSISTORS; PRINTED CIRCUIT BOARDS AND CIRCUIT CARD ASSEMBLIES; AND FILTERS AND NETWORKS.
Characteristics (Decoded)
MRC | Requirements Statement | Clear Text Reply |
---|---|---|
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
CQZP | INPUT CIRCUIT PATTERN | 13 INPUT |
CZEQ | TIME RATING PER CHACTERISTIC | 10.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 10.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
CSSL | DESIGN FUNCTION AND QUANTITY | 1 CONVERTER, DIGITAL TO ANALOG |
CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | C-3 MIL-M-38510 |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD |
CQSZ | INCLOSURE CONFIGURATION | LEADLESS FLAT PACK |
CBBL | FEATURES PROVIDED | BURN IN AND HERMETICALLY SEALED AND ELECTROSTATIC SENSITIVE AND MONOLITHIC |
ADAU | BODY HEIGHT | 0.060 INCHES MINIMUM AND 0.100 INCHES MAXIMUM |
ADAQ | BODY LENGTH | 0.395 INCHES MINIMUM AND 0.410 INCHES MAXIMUM |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 6.0 VOLTS MAXIMUM POWER SOURCE |
ADAT | BODY WIDTH | 0.395 INCHES MINIMUM AND 0.410 INCHES MAXIMUM |
TTQY | TERMINAL TYPE AND QUANTITY | 24 LEADLESS |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
CRHL | BIT QUANTITY (NON-CORE) | 8 |