Part Number
Part Number:
NSN:
NIIN:
Item Name:
MICROCIRCUIT , DIGITAL
Definition:
A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".
CAGE Information
| Code | Company |
|---|---|
| U2982 | BAE SYSTEMS DEFENCE SYSTEMS LTD |
Characteristics (Decoded)
| MRC | Requirements Statement | Clear Text Reply |
|---|---|---|
| AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
| AEHX | MAXIMUM POWER DISSIPATION RATING | 497.0 MILLIWATTS |
| TTQY | TERMINAL TYPE AND QUANTITY | 28 PRINTED CIRCUIT |
| CSSL | DESIGN FUNCTION AND QUANTITY | 1 BUFFER |
| AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
| CBBL | FEATURES PROVIDED | TESTED TO MIL-STD-883 |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -0.5 VOLTS MINIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE |
| CQSJ | INCLOSURE MATERIAL | CERAMIC |
| CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD |
| CXCY | PART NAME ASSIGNED BY CONTROLLING AGENCY | SCAN TEST DEVICE W/ OCTAL BUFFER,INVERTING 3-STATE OUTPUTS |
| CQSZ | INCLOSURE CONFIGURATION | LEADLESS FLAT PACK |
| FEAT | SPECIAL FEATURES | MONOLITHIC SILICON; POSITIVE-NAND GATES, QUAD 2-INPUT |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER |