National Stock Number (NSN) Output Data
NSN:
NIIN:
Item Name:
MICROCIRCUIT , DIGITAL
Definition:
A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".
Reference/Part Number
Part Number | CAGE | Status | RNCC | RNVC | DAC | RNAAC | MSDS | SADC |
---|---|---|---|---|---|---|---|---|
910423-080T1 | 80249 | A | 5 | 2 | 6 | CL | ||
SN5480F11 | 01295 | A | 3 | 2 | 6 | CL |
CAGE Information
Code | Company |
---|---|
01295 | TEXAS INSTRUMENTS INCORPORATED DBA T |
80249 | BAE SYSTEMS INFORMATION AND ELECTRON |
Characteristics (Decoded)
MRC | Requirements Statement | Clear Text Reply |
---|---|---|
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
AEHX | MAXIMUM POWER DISSIPATION RATING | 270.0 MILLIWATTS |
CZEQ | TIME RATING PER CHACTERISTIC | 70.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 80.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
PRMT | PRECIOUS MATERIAL | GOLD |
ADAU | BODY HEIGHT | 0.035 INCHES MINIMUM AND 0.050 INCHES MAXIMUM |
CQZP | INPUT CIRCUIT PATTERN | 9 INPUT |
ADAQ | BODY LENGTH | 0.250 INCHES MINIMUM AND 0.260 INCHES MAXIMUM |
CQSJ | INCLOSURE MATERIAL | GLASS AND METAL |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND MONOLITHIC AND POSITIVE OUTPUTS AND MEDIUM POWER AND MEDIUM SPEED AND DARLINGTON-CONNECTED AND COMPLEMENTARY OUTPUTS |
CQSZ | INCLOSURE CONFIGURATION | FLAT PACK |
FEAT | SPECIAL FEATURES | FORMED LEADS; INSULATOR FURNISHED |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
PMLC | PRECIOUS MATERIAL AND LOCATION | TERMINAL AND BODY SURFACES GOLD |
CSSL | DESIGN FUNCTION AND QUANTITY | 1 ADDER, FULL, BINARY |
CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
ADAT | BODY WIDTH | 0.140 INCHES MINIMUM AND 0.150 INCHES MAXIMUM |
CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | T0-84 JOINT ELECTRON DEVICE ENGINEERING COUNCIL |