National Stock Number (NSN) Output Data
NSN:
NIIN:
Item Name:
MICROCIRCUIT , DIGITAL
Definition:
A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".
Reference/Part Number
Part Number | CAGE | Status | RNCC | RNVC | DAC | RNAAC | MSDS | SADC |
---|---|---|---|---|---|---|---|---|
BL4586240 | D0894 | A | 5 | 2 | 1 | ZG | ||
SNC54S113J | 01295 | A | 5 | 2 | 5 | KE | ||
CS300037-1 | U2248 | A | 5 | 2 | 2 | ZK | ||
615190-901 | 37695 | A | 3 | 2 | 1 | KE | ||
SN54S113J | 01295 | A | 5 | 1 | 5 | KE | ||
VA-85-2649-001 | K0668 | A | 5 | 2 | 4 | ZK | ||
SN54S113J00 | 01295 | A | 5 | 2 | 6 | 9Z |
CAGE Information
Code | Company |
---|---|
01295 | TEXAS INSTRUMENTS INCORPORATED DBA T |
D0894 | ROHDE & SCHWARZ GMBH & CO. KG |
U2248 | SELEX ELSAG LTD |
37695 | RAYTHEON COMPANY DBA RAYTHEON |
K0668 | SELEX GALILEO LTD DBA SELEX S & A S |
Federal Supply Class
Title
MICROCIRCUITS, ELECTRONIC
Inclusions:
INCLUDES INTEGRATED CIRCUIT DEVICES; INTEGRATED CIRCUIT MODULES, INTEGRATED ELECTRONIC DEVICES: HYBRID, MAGNETIC, MOLECULAR, OPTO-ELECTRONIC, AND THIN FILM.
Exclusions:
EXCLUDES SINGLE CIRCUIT ELEMENTS SUCH AS CAPACITORS; RESISTORS; DIODES AND TRANSISTORS; PRINTED CIRCUIT BOARDS AND CIRCUIT CARD ASSEMBLIES; AND FILTERS AND NETWORKS.
Characteristics (Decoded)
MRC | Requirements Statement | Clear Text Reply |
---|---|---|
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
CBBL | FEATURES PROVIDED | W/CLOCK AND NEGATIVE EDGE TRIGGERED AND W/PRESET AND HERMETICALLY SEALED AND SCHOTTKY |
ADAT | BODY WIDTH | 0.245 INCHES MINIMUM AND 0.280 INCHES MAXIMUM |
ADAQ | BODY LENGTH | 0.755 INCHES MINIMUM AND 0.785 INCHES MAXIMUM |
ADAU | BODY HEIGHT | 0.180 INCHES NOMINAL |
CZEQ | TIME RATING PER CHACTERISTIC | 7.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 7.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
CQZP | INPUT CIRCUIT PATTERN | DUAL 4 INPUT |
CQSJ | INCLOSURE MATERIAL | CERAMIC AND GLASS |
CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD |
CSSL | DESIGN FUNCTION AND QUANTITY | 2 FLIP-FLOP, J-K |
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