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National Stock Number (NSN) Output Data

NSN:
NIIN:
Item Name:
MICROCIRCUIT , DIGITAL

Definition:

A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".

Reference/Part Number

Part Number CAGE Status RNCC RNVC DAC RNAAC MSDS SADC
280-22049-114 81205 A C 1 3 TX AW
DM7832D 27014 A C 1 3 TX
805535-1 96214 A 5 2 2 9Z
TEST-CASE-1 08219 H 5 9 3 TX
91550734 F6481 A 5 2 4 ZF
DM7832J/B 34335 A 3 2 6 TX
DS7832J/883B 27014 A 5 9 3 TX
0213-1-1295-2 15942 F 5 2 1 TX
DM7832J/883B 34335 A 5 9 3 TX
581R500L24 97942 A 5 2 5 TX
DM8832AN 12040 F C 1 9 TU
DM7832J/883BA C7191 A 5 9 6 ZG
DM7832J/883B C7191 A 5 2 6 ZG
DM7832J/883B 27014 A 5 9 3 TX

CAGE Information

Code Company
08219 STONE SAFETY CORP
81205 THE BOEING COMPANY DBA BOEING DIV DE
27014 NATIONAL SEMICONDUCTOR CORPORATION
96214 RAYTHEON COMPANY
F6481 THALES
34335 ADVANCED MICRO DEVICES, INC. DBA A M
15942 USACECOM INTELLIGENCE ELECTRONIC WAR
97942 NORTHROP GRUMMAN SYSTEMS CORPORATION
12040 NATIONAL SEMICONDUCTOR CORP
C7191 ADELCO ELEKTRONIK GMBH

Federal Supply Class

Title

MICROCIRCUITS, ELECTRONIC

Inclusions:

INCLUDES INTEGRATED CIRCUIT DEVICES; INTEGRATED CIRCUIT MODULES, INTEGRATED ELECTRONIC DEVICES: HYBRID, MAGNETIC, MOLECULAR, OPTO-ELECTRONIC, AND THIN FILM.

Exclusions:

EXCLUDES SINGLE CIRCUIT ELEMENTS SUCH AS CAPACITORS; RESISTORS; DIODES AND TRANSISTORS; PRINTED CIRCUIT BOARDS AND CIRCUIT CARD ASSEMBLIES; AND FILTERS AND NETWORKS.

Characteristics (Decoded)

MRC Requirements Statement Clear Text Reply
CQSZ INCLOSURE CONFIGURATION DUAL-IN-LINE
AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS
CBBL FEATURES PROVIDED HERMETICALLY SEALED AND W/DISABLE AND W/ENABLE
ADAT BODY WIDTH 0.250 INCHES MINIMUM AND 0.280 INCHES MAXIMUM
ADAQ BODY LENGTH 0.750 INCHES MINIMUM AND 0.785 INCHES MAXIMUM
CZEQ TIME RATING PER CHACTERISTIC 12.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT
AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS
TEST TEST DATA DOCUMENT 81349-MIL-STD-883 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTING GENERAL TYPE DATA ON CERTAIN ENVIRONMENTAL AND PERFORMANCE REQUIREMENTS AND TEST CONDITIONS THAT ARE SHOWN AS "TYPICAL
CQSJ INCLOSURE MATERIAL CERAMIC AND GLASS
CQWX OUTPUT LOGIC FORM TRANSISTOR-TRANSISTOR LOGIC
ADAU BODY HEIGHT 0.130 INCHES MINIMUM AND 0.160 INCHES MAXIMUM
CQZP INPUT CIRCUIT PATTERN 10 INPUT
CSSL DESIGN FUNCTION AND QUANTITY 2 DRIVER, LINE AND 4 DRIVER, LINE

Similar Parts

TEST-CASE-1 , TESTCASE1 , 5962-01-019-6176 , 5962010196176 , 010196176 , 280-22049-114 , DM7832D , 805535-1 , TEST-CASE-1 , 91550734 , DM7832J/B , DS7832J/883B , 0213-1-1295-2 , DM7832J/883B , 581R500L24 , DM8832AN , DM7832J/883BA , DM7832J/883B , DM7832J/883B ,