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Part Number

Part Number:
NSN:
NIIN:
Item Name:
MICROCIRCUIT , DIGITAL

Definition:

A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".

CAGE Information

Code Company
12436 BAE SYSTEMS NATIONAL SECURITY SOLUTI

Federal Supply Class

Title

MICROCIRCUITS, ELECTRONIC

Inclusions:

INCLUDES INTEGRATED CIRCUIT DEVICES; INTEGRATED CIRCUIT MODULES, INTEGRATED ELECTRONIC DEVICES: HYBRID, MAGNETIC, MOLECULAR, OPTO-ELECTRONIC, AND THIN FILM.

Exclusions:

EXCLUDES SINGLE CIRCUIT ELEMENTS SUCH AS CAPACITORS; RESISTORS; DIODES AND TRANSISTORS; PRINTED CIRCUIT BOARDS AND CIRCUIT CARD ASSEMBLIES; AND FILTERS AND NETWORKS.

Characteristics (Decoded)

MRC Requirements Statement Clear Text Reply
CQSZ INCLOSURE CONFIGURATION DUAL-IN-LINE
AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS
ADAQ BODY LENGTH 0.970 INCHES MAXIMUM
ADAU BODY HEIGHT 0.205 INCHES MAXIMUM
TTQY TERMINAL TYPE AND QUANTITY 20 PRINTED CIRCUIT
CSSL DESIGN FUNCTION AND QUANTITY 8 LATCH
ADAT BODY WIDTH 0.285 INCHES MAXIMUM
AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS
CQSJ INCLOSURE MATERIAL CERAMIC
CZEN VOLTAGE RATING AND TYPE PER CHARACTERISTIC 7.0 VOLTS MAXIMUM POWER SOURCE
CQWX OUTPUT LOGIC FORM TRANSISTOR-TRANSISTOR LOGIC
CBBL FEATURES PROVIDED 3-STATE OUTPUT AND BURN IN AND HERMETICALLY SEALED AND MONOLITHIC AND W/ENABLE
TEST TEST DATA DOCUMENT 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.).
CZEQ TIME RATING PER CHACTERISTIC ERR-060 NOMINAL HAND PULL AND ERR-060 NOMINAL HAND
CQZP INPUT CIRCUIT PATTERN 10 INPUT
CWSG TERMINAL SURFACE TREATMENT SOLDER

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