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Part Number

Part Number:
NSN:
NIIN:
Item Name:
MICROCIRCUIT , DIGITAL

Definition:

A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".

CAGE Information

Code Company
37695 RAYTHEON COMPANY DBA RAYTHEON

Federal Supply Class

Title

MICROCIRCUITS, ELECTRONIC

Inclusions:

INCLUDES INTEGRATED CIRCUIT DEVICES; INTEGRATED CIRCUIT MODULES, INTEGRATED ELECTRONIC DEVICES: HYBRID, MAGNETIC, MOLECULAR, OPTO-ELECTRONIC, AND THIN FILM.

Exclusions:

EXCLUDES SINGLE CIRCUIT ELEMENTS SUCH AS CAPACITORS; RESISTORS; DIODES AND TRANSISTORS; PRINTED CIRCUIT BOARDS AND CIRCUIT CARD ASSEMBLIES; AND FILTERS AND NETWORKS.

Characteristics (Decoded)

MRC Requirements Statement Clear Text Reply
CQSZ INCLOSURE CONFIGURATION DUAL-IN-LINE
AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS
AEHX MAXIMUM POWER DISSIPATION RATING 500.0 MILLIWATTS
ADAU BODY HEIGHT 0.075 INCHES MINIMUM AND 0.100 INCHES MAXIMUM
AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS
CQSJ INCLOSURE MATERIAL CERAMIC
ADAQ BODY LENGTH 0.180 INCHES MINIMUM AND 0.220 INCHES MAXIMUM
AGAV END ITEM IDENTIFICATION AN/ARC-164 V
CBBL FEATURES PROVIDED ELECTROSTATIC SENSITIVE AND 3-STATE OUTPUT AND W/CLOCK AND W/RESISTOR AND W/ENABLE
CQWX OUTPUT LOGIC FORM COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC
TEST TEST DATA DOCUMENT 96906-MIL-STD-883 STANDARD
CZEN VOLTAGE RATING AND TYPE PER CHARACTERISTIC 11.0 VOLTS MAXIMUM POWER SOURCE
CQZP INPUT CIRCUIT PATTERN 18 INPUT
ADAT BODY WIDTH 0.580 INCHES MINIMUM AND 0.620 INCHES MAXIMUM
TTQY TERMINAL TYPE AND QUANTITY 40 PRINTED CIRCUIT
CSSL DESIGN FUNCTION AND QUANTITY 1 MICROPROCESSOR
CWSG TERMINAL SURFACE TREATMENT SOLDER

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