Part Number
Part Number:
NSN:
NIIN:
Item Name:
MICROCIRCUIT , DIGITAL
Definition:
A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".
CAGE Information
| Code | Company |
|---|---|
| 16331 | LOCKHEED MARTIN CORPORATION DBA LOCK |
Characteristics (Decoded)
| MRC | Requirements Statement | Clear Text Reply |
|---|---|---|
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| CBBL | FEATURES PROVIDED | W/BUFFERED OUTPUT AND W/STROBE AND MONOLITHIC |
| ADAT | BODY WIDTH | 0.240 INCHES MINIMUM AND 0.260 INCHES MAXIMUM |
| AFGA | OPERATING TEMP RANGE | +0.0/+70.0 DEG CELSIUS |
| ADAU | BODY HEIGHT | 0.180 INCHES NOMINAL |
| ADAQ | BODY LENGTH | 0.870 INCHES MAXIMUM |
| CZEQ | TIME RATING PER CHACTERISTIC | 20.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 24.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
| CSSL | DESIGN FUNCTION AND QUANTITY | 4 SELECTOR, DATA, MULTIPLEXER, TWO TO ONE LINE |
| AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
| CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
| TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD |
| ABKW | OVERALL HEIGHT | 0.325 INCHES NOMINAL |
| AEHX | MAXIMUM POWER DISSIPATION RATING | 49.0 MILLIWATTS |
| CQSJ | INCLOSURE MATERIAL | PLASTIC |
| CQZP | INPUT CIRCUIT PATTERN | 10 INPUT |