Part Number
Part Number:
NSN:
NIIN:
Item Name:
TEST SET GROUP , ELECTRONIC SYSTEM
Definition:
A TEST SET SPECIFICALLY DESIGNED FOR USE IN MAKING EXAMINATIONS AND PROVIDING DISCRETE EVALUATIONS OF THE OVERALL PERFORMANCE OF A SYSTEM(S) OR SUBSYSTEM. A SYSTEM CONSISTS OF TWO OR MORE SETS, A SUBSYSTEM IS GROUPING OF TWO OR MORE SETS.
CAGE Information
| Code | Company |
|---|---|
| 11530 | LOCKHEED MARTIN CORPORATION DIV LOCK |
Federal Supply Class
Title
ELECTRICAL AND ELECTRONIC PROPER
Inclusions:
INCLUDES TEST LEADS AND TEST LEAD ATTACHMENTS; TEST INSTRUMENTS DESIGNED FOR COMMUNICATION EQUIPMENT; TEST INSTRUMENTS DESIGNED FOR USE WITH ELECTRONIC EQUIPMENT CLASSIFIED IN TWO OR MORE FSC GROUPS.
Exclusions:
EXCLUDES RADIAC EQUIPMENT
Characteristics (Decoded)
| MRC | Requirements Statement | Clear Text Reply |
|---|---|---|
| AJJX | COMPONENT DOCUMENT ORIGIN | GOVERNMENT |
| AJJX | COMPONENT DOCUMENT ORIGIN | GOVERNMENT |
| AYDR | DOCUMENT IDENTIFICATION | DQ189/FSC |
| AKWA | JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM NAME | TEST SET GROUP,ELECTRONIC SYSTEMS |
| AJJZ | DOCUMENT TYPE | NOMENCLATURE CARD |
| AKWB | JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM TYPE NUMBER | OQ189/FSC |
| AJKB | COMPONENT DOCUMENT PAGE NUMBER | 1 |