National Stock Number (NSN) Output Data
NSN:
NIIN:
Item Name:
TEST SET , SEMICONDUCTOR DEVICE
Definition:
A TEST SET SPECIFICALLY DESIGNED FOR USE IN MAKING EXAMINATIONS OF DIODES, TRANSISTORS, AND THE LIKE. THESE EXAMINATIONS MAY BE EFFECTED IN OR OUT OF CIRCUIT OR BOTH.
Reference/Part Number
| Part Number | CAGE | Status | RNCC | RNVC | DAC | RNAAC | MSDS | SADC |
|---|---|---|---|---|---|---|---|---|
| R16ANTS286U | 99993 | A | 3 | 2 | X | XX | ||
| TS268U | 80058 | M | 3 | 2 | X | CL |
CAGE Information
| Code | Company |
|---|---|
| 80058 | JOINT ELECTRONICS TYPE DESIGNATION S |
| 99993 | DEPARTMENT OF THE NAVY |
Federal Supply Class
Title
ELECTRICAL AND ELECTRONIC PROPER
Inclusions:
INCLUDES TEST LEADS AND TEST LEAD ATTACHMENTS; TEST INSTRUMENTS DESIGNED FOR COMMUNICATION EQUIPMENT; TEST INSTRUMENTS DESIGNED FOR USE WITH ELECTRONIC EQUIPMENT CLASSIFIED IN TWO OR MORE FSC GROUPS.
Exclusions:
EXCLUDES RADIAC EQUIPMENT
Characteristics (Decoded)
| MRC | Requirements Statement | Clear Text Reply |
|---|---|---|
| HGTH | HEIGHT | 2.625 INCHES NOMINAL |
| HGTH | HEIGHT | 2.625 INCHES NOMINAL |
| AQXZ | OPERATING TEST CAPABILITY | INDICATED RES 500 OHMS FOR GOOD CRYSTALS; RES RATIO 10 TO 1 FOR GOOD CRYSTALS |
| ANNQ | MATERIAL AND LOCATION | ALUMINUM CARRYING CASE |
| AQXY | TEST TYPE FOR WHICH DESIGNED | TESTING FROM RESISTANCE,BACK RESISTANCE AND BACK CONDUCTANCE OF JAN CRYSTALS |
| ABGL | WIDTH | 4.375 INCHES NOMINAL |
| ZZZT | NONDEFINITIVE SPEC/STD DATA | NO. TS-268/U SERIES TYPE |
| ANPZ | INCLOSURE FEATURE | SINGLE ITEM W/CARRYING CASE |
| ABRY | LENGTH | 7.375 INCHES NOMINAL |
| ALSF | INTERNAL BATTERY ACCOMMODATION | INCLUDED |