National Stock Number (NSN) Output Data
NSN:
NIIN:
Item Name:
TEST SET , SEMICONDUCTOR DEVICE
Definition:
A TEST SET SPECIFICALLY DESIGNED FOR USE IN MAKING EXAMINATIONS OF DIODES, TRANSISTORS, AND THE LIKE. THESE EXAMINATIONS MAY BE EFFECTED IN OR OUT OF CIRCUIT OR BOTH.
Reference/Part Number
Part Number | CAGE | Status | RNCC | RNVC | DAC | RNAAC | MSDS | SADC |
---|---|---|---|---|---|---|---|---|
ESL1 | 21825 | F | 3 | 9 | X | XX |
CAGE Information
Code | Company |
---|---|
21825 | DYNATRAN ELECTRONIC CO |
Characteristics (Decoded)
MRC | Requirements Statement | Clear Text Reply |
---|---|---|
ANPZ | INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
ACYN | AC VOLTAGE RATING | 105.0 VOLTS MINIMUM AND 125.0 VOLTS MAXIMUM |
ZZZV | FSC APPLICATION DATA | DIODE SEMICONDUCTOR DEVICES TEST SETS,EXCEPT SPECIALLY DESIGNED |
AQXZ | OPERATING TEST CAPABILITY | FORWARD VOLTAGE 0 TO 20V FORWARD CURRENT 0 TO 500 MA REVERSE VOLTAGE 0 TO 300V REVERSE CURRENT 0 TO 5MA |
HGTH | HEIGHT | 9.250 INCHES NOMINAL |
ALSF | INTERNAL BATTERY ACCOMMODATION | NOT INCLUDED |
ABRY | LENGTH | 8.000 INCHES NOMINAL |
ABGL | WIDTH | 111.500 INCHES NOMINAL |
ACZB | FREQUENCY RATING | 50.0 HERTZ MINIMUM AND 60.0 HERTZ MAXIMUM |
ANNQ | MATERIAL AND LOCATION | STEEL HOUSING |
AQXY | TEST TYPE FOR WHICH DESIGNED | MEASUREMENT OF STATIC CHARACTERISTICS OF MEDIUM AND LOWER POWER DIODES |
FAAZ | PHASE | SINGLE |