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Part Number

Part Number:
NSN:
NIIN:
Item Name:
MICROCIRCUIT , DIGITAL

Definition:

A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".

CAGE Information

Code Company
10236 ELECTRODYNAMICS INC. DBA L-3 COMMUNI

Federal Supply Class

Title

MICROCIRCUITS, ELECTRONIC

Inclusions:

INCLUDES INTEGRATED CIRCUIT DEVICES; INTEGRATED CIRCUIT MODULES, INTEGRATED ELECTRONIC DEVICES: HYBRID, MAGNETIC, MOLECULAR, OPTO-ELECTRONIC, AND THIN FILM.

Exclusions:

EXCLUDES SINGLE CIRCUIT ELEMENTS SUCH AS CAPACITORS; RESISTORS; DIODES AND TRANSISTORS; PRINTED CIRCUIT BOARDS AND CIRCUIT CARD ASSEMBLIES; AND FILTERS AND NETWORKS.

Characteristics (Decoded)

MRC Requirements Statement Clear Text Reply
CQSZ INCLOSURE CONFIGURATION DUAL-IN-LINE
AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS
ADAU BODY HEIGHT 0.200 INCHES MAXIMUM
CBBL FEATURES PROVIDED HERMETICALLY SEALED AND BURN IN AND W/ENABLE AND SCHOTTKY AND LOW POWER
CZEQ TIME RATING PER CHACTERISTIC 25.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 25.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT
ADAQ BODY LENGTH 0.785 INCHES MAXIMUM
CQSJ INCLOSURE MATERIAL CERAMIC AND GLASS
CQWX OUTPUT LOGIC FORM TRANSISTOR-TRANSISTOR LOGIC
AFJQ STORAGE TEMP RANGE -65.0/+165.0 DEG CELSIUS
TEST TEST DATA DOCUMENT 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.).
ADAT BODY WIDTH 0.291 INCHES MAXIMUM
CSSL DESIGN FUNCTION AND QUANTITY 4 RECEIVER, LINE DIFFERENTIAL
CQZP INPUT CIRCUIT PATTERN 10 INPUT

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