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Part Number

Part Number:
NSN:
NIIN:
Item Name:
MICROCIRCUIT , DIGITAL

Definition:

A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".

CAGE Information

Code Company
10236 ELECTRODYNAMICS INC. DBA L-3 COMMUNI

Federal Supply Class

Title

MICROCIRCUITS, ELECTRONIC

Inclusions:

INCLUDES INTEGRATED CIRCUIT DEVICES; INTEGRATED CIRCUIT MODULES, INTEGRATED ELECTRONIC DEVICES: HYBRID, MAGNETIC, MOLECULAR, OPTO-ELECTRONIC, AND THIN FILM.

Exclusions:

EXCLUDES SINGLE CIRCUIT ELEMENTS SUCH AS CAPACITORS; RESISTORS; DIODES AND TRANSISTORS; PRINTED CIRCUIT BOARDS AND CIRCUIT CARD ASSEMBLIES; AND FILTERS AND NETWORKS.

Characteristics (Decoded)

MRC Requirements Statement Clear Text Reply
CQSZ INCLOSURE CONFIGURATION DUAL-IN-LINE
AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS
CTFT CASE OUTLINE SOURCE AND DESIGNATOR MO-001-AD JOINT ELECTRON DEVICE ENGINEERING COUNCIL
ADAT BODY WIDTH 0.240 INCHES MINIMUM AND 0.260 INCHES MAXIMUM
ADAU BODY HEIGHT 0.095 INCHES MINIMUM AND 0.100 INCHES MAXIMUM
AEHX MAXIMUM POWER DISSIPATION RATING 500.0 MILLIWATTS
CQWX OUTPUT LOGIC FORM COMPLEMENTARY-OXIDIZED-SILICON LOGIC
AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS
CBBL FEATURES PROVIDED HERMETICALLY SEALED AND MONOLITHIC
TEST TEST DATA DOCUMENT 81349-MIL-M-38510 SPECIFICATION OR 96906-883 STANDARD
CQZP INPUT CIRCUIT PATTERN DUAL 4 INPUT
CQSJ INCLOSURE MATERIAL CERAMIC AND GLASS
ADAQ BODY LENGTH 0.745 INCHES MINIMUM AND 0.770 INCHES MAXIMUM
CSSL DESIGN FUNCTION AND QUANTITY 1 GATE, NAND

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