Part Number
Part Number:
NSN:
NIIN:
Item Name:
MICROCIRCUIT , MEMORY
Definition:
A CIRCUIT DESIGNED TO STORE INFORMATION AND/OR CODED INSTRUCTIONS FOR LATER USE. ITEM HAS PINS OR OTHER CONNECTIONS TO INSTALL IN A COMPUTER OR COMPUTING DEVICE. DOES NOT INCLUDE MAGNETIC DRUMS, TAPES, PUNCHED CARDS OR THE LIKE. FOR ITEMS THAT HAVE PORTABLE TYPE CONNECTIONS SEE MEMORY, PORTABLE, SOLID STATE.
CAGE Information
| Code | Company |
|---|---|
| 99971 | LOCKHEED MARTIN CORP NAVAL ELECTRONI |
Characteristics (Decoded)
| MRC | Requirements Statement | Clear Text Reply |
|---|---|---|
| AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
| ADAQ | BODY LENGTH | 0.342 INCHES MINIMUM AND 0.358 INCHES MAXIMUM |
| AGAV | END ITEM IDENTIFICATION | PACER DAWN |
| CXCY | PART NAME ASSIGNED BY CONTROLLING AGENCY | MICROCIRCUIT, PROGRAMMED (PAL C16R4-20) |
| AEHX | MAXIMUM POWER DISSIPATION RATING | 1.0 WATTS |
| CRTL | CRITICALITY CODE JUSTIFICATION | CBBL |
| ADAT | BODY WIDTH | 0.342 INCHES MINIMUM AND 0.358 INCHES MAXIMUM |
| FEAT | SPECIAL FEATURES | ALTERED ITEM PROGRAMMED USING 67268 5962-8871312XA USING PROGRAMMING INSTRUCTION 7554025P3 |
| CTQX | CURRENT RATING PER CHARACTERISTIC | 24.00 MILLIAMPERES REVERSE CURRENT, DC NOMINAL |
| AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
| CZER | MEMORY DEVICE TYPE | PAL |
| CBBL | FEATURES PROVIDED | BURN IN, MIL-STD-883, CLASS B AND PROGRAMMED AND MONOLITHIC AND ELECTROSTATIC SENSITIVE AND TESTED TO MIL-STD-883 |
| CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | C-2A MIL-M-38510 |
| CZEP | CAPITANCE RATING PER CHARACTERISTIC | 7.00 INPUT PASCAL INDUSTRIAL LIGHT TANK STOCK AND 7.00 OUTPUT PASCAL INDUSTRIAL LIGHT TANK STOCK |
| CQSJ | INCLOSURE MATERIAL | CERAMIC |
| CQZP | INPUT CIRCUIT PATTERN | 16 INPUT |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -3.0 VOLTS MINIMUM INPUT AND -0.5 VOLTS MINIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM INPUT |
| ADAU | BODY HEIGHT | 0.060 INCHES MINIMUM AND 0.078 INCHES MAXIMUM |
| CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD |
| CQSZ | INCLOSURE CONFIGURATION | LEADLESS FLAT PACK |
| CZEQ | TIME RATING PER CHACTERISTIC | 20.00 NANOSECONDS NOMINAL ACCESS |
| TTQY | TERMINAL TYPE AND QUANTITY | 20 LEADLESS |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER |