Part Number
Part Number:
NSN:
NIIN:
Item Name:
MICROCIRCUIT , MEMORY
Definition:
A CIRCUIT DESIGNED TO STORE INFORMATION AND/OR CODED INSTRUCTIONS FOR LATER USE. ITEM HAS PINS OR OTHER CONNECTIONS TO INSTALL IN A COMPUTER OR COMPUTING DEVICE. DOES NOT INCLUDE MAGNETIC DRUMS, TAPES, PUNCHED CARDS OR THE LIKE. FOR ITEMS THAT HAVE PORTABLE TYPE CONNECTIONS SEE MEMORY, PORTABLE, SOLID STATE.
CAGE Information
Code | Company |
---|---|
99971 | LOCKHEED MARTIN CORP NAVAL ELECTRONI |
Characteristics (Decoded)
MRC | Requirements Statement | Clear Text Reply |
---|---|---|
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
CTQX | CURRENT RATING PER CHARACTERISTIC | 80.00 MILLIAMPERES REVERSE CURRENT, DC ABSOLUTE |
AGAV | END ITEM IDENTIFICATION | PACER DAWN |
FEAT | SPECIAL FEATURES | ALTERED ITEM PROGRAMMED USING 67268 5962-8852506YA (WHICH IS 81349 M38510/26105BYA) USING PROGRAMMING INSTRUCTION 7554018P8 |
TTQY | TERMINAL TYPE AND QUANTITY | 32 LEADLESS |
CSWJ | WORD QUANTITY (NON-CORE) | 32768 |
AEHX | MAXIMUM POWER DISSIPATION RATING | 1.0 WATTS |
CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | C-12 MIL-M-38510 |
CZEP | CAPITANCE RATING PER CHARACTERISTIC | 10.00 INPUT PICOFARADS MAXIMUM AND 10.00 OUTPUT PICOFARADS MAXIMUM |
CRTL | CRITICALITY CODE JUSTIFICATION | CBBL |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -0.3 VOLTS MINIMUM POWER SOURCE AND 6.2 VOLTS MAXIMUM POWER SOURCE AND -0.3 VOLTS MINIMUM INPUT AND 6.2 VOLTS MAXIMUM INPUT |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
CZEQ | TIME RATING PER CHACTERISTIC | 150.00 NANOSECONDS AF OUTPUT MEGAWATTS AND 10.00 MILLISECONDS AGC THRESHOLD TORR |
CBBL | FEATURES PROVIDED | ELECTROSTATIC SENSITIVE AND ERASABLE AND MONOLITHIC AND PROGRAMMED AND BURN IN, MIL-STD-883, CLASS B AND ELECTRICALLY ALTERABLE AND TESTED TO MIL-STD-883 |
ADAT | BODY WIDTH | 0.442 INCHES MINIMUM AND 0.458 INCHES MAXIMUM |
ADAQ | BODY LENGTH | 0.540 INCHES MINIMUM AND 0.560 INCHES MAXIMUM |
CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD |
CQZP | INPUT CIRCUIT PATTERN | 8 INPUT |
CXCY | PART NAME ASSIGNED BY CONTROLLING AGENCY | MICROCIRCUIT, PROGRAMMED (EEPROM X28C256EMB-25 |
CQSZ | INCLOSURE CONFIGURATION | LEADLESS FLAT PACK |
CRHL | BIT QUANTITY (NON-CORE) | 262144 |
ADAU | BODY HEIGHT | 0.060 INCHES MINIMUM AND 0.120 INCHES MAXIMUM |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
CZER | MEMORY DEVICE TYPE | EEPROM |