Part Number
Part Number:
NSN:
NIIN:
Item Name:
MICROCIRCUIT , DIGITAL
Definition:
A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".
CAGE Information
Code | Company |
---|---|
14304 | HARRIS CORPORATION DBA HARRIS RF COM |
Characteristics (Decoded)
MRC | Requirements Statement | Clear Text Reply |
---|---|---|
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
ADAU | BODY HEIGHT | 0.106 INCHES MINIMUM AND 0.180 INCHES MAXIMUM |
ADAT | BODY WIDTH | 0.240 INCHES MINIMUM AND 0.260 INCHES MAXIMUM |
TTQY | TERMINAL TYPE AND QUANTITY | 14 PRINTED CIRCUIT |
CBBL | FEATURES PROVIDED | HIGH RELIABILITY AND MONOLITHIC AND BURN IN |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
ABHP | OVERALL LENGTH | 0.745 INCHES MINIMUM AND 0.770 INCHES MAXIMUM |
CSSL | DESIGN FUNCTION AND QUANTITY | 4 GATE, AND |
AEHX | MAXIMUM POWER DISSIPATION RATING | 200.0 MILLIWATTS |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
ADAQ | BODY LENGTH | 0.745 INCHES MINIMUM AND 0.770 INCHES MAXIMUM |
CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD |
CQZP | INPUT CIRCUIT PATTERN | QUAD 2 INPUT |
ABMK | OVERALL WIDTH | 0.300 INCHES MINIMUM AND 0.325 INCHES MAXIMUM |
CZEQ | TIME RATING PER CHACTERISTIC | 320.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT AND 420.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT |
ABKW | OVERALL HEIGHT | 0.281 INCHES MINIMUM AND 0.350 INCHES MAXIMUM |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -0.5 VOLTS MINIMUM POWER SOURCE AND 18.0 VOLTS MAXIMUM POWER SOURCE |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |