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Part Number

Part Number:
NSN:
NIIN:
Item Name:
MICROCIRCUIT , LINEAR

Definition:

A MICROCIRCUIT WHOSE OUTPUT IS A FUNCTION OF THE INPUT; THAT IS, THE OUTPUT VARIES IN A PREDETERMINED AND ESSENTIALLY PREDICTABLE MANNER FROM THE INPUT SIGNAL.

CAGE Information

Code Company
09691 L-3 COMMUNICATIONS ELECTRONIC SYSTEM

Federal Supply Class

Title

MICROCIRCUITS, ELECTRONIC

Inclusions:

INCLUDES INTEGRATED CIRCUIT DEVICES; INTEGRATED CIRCUIT MODULES, INTEGRATED ELECTRONIC DEVICES: HYBRID, MAGNETIC, MOLECULAR, OPTO-ELECTRONIC, AND THIN FILM.

Exclusions:

EXCLUDES SINGLE CIRCUIT ELEMENTS SUCH AS CAPACITORS; RESISTORS; DIODES AND TRANSISTORS; PRINTED CIRCUIT BOARDS AND CIRCUIT CARD ASSEMBLIES; AND FILTERS AND NETWORKS.

Characteristics (Decoded)

MRC Requirements Statement Clear Text Reply
AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS
PRMT PRECIOUS MATERIAL GOLD
CSSL DESIGN FUNCTION AND QUANTITY 2 DRIVER, SWITCH, FIELD EFFECT TRANSISTOR
CQSJ INCLOSURE MATERIAL GLASS AND METAL
CWSG TERMINAL SURFACE TREATMENT GOLD
AEHX MAXIMUM POWER DISSIPATION RATING 450.0 MILLIWATTS
PMLC PRECIOUS MATERIAL AND LOCATION TERMINALS GOLD
AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS
ADAU BODY HEIGHT 0.165 INCHES MINIMUM AND 0.185 INCHES MAXIMUM
CZEQ TIME RATING PER CHACTERISTIC 130.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 250.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT
CTFT CASE OUTLINE SOURCE AND DESIGNATOR T0-100 JOINT ELECTRON DEVICE ENGINEERING COUNCIL
TEST TEST DATA DOCUMENT 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.).
ADAR BODY OUTSIDE DIAMETER 0.335 INCHES MINIMUM AND 0.370 INCHES MAXIMUM
CQSZ INCLOSURE CONFIGURATION CAN
CQZP INPUT CIRCUIT PATTERN 2 CHANNEL
CBBL FEATURES PROVIDED HERMETICALLY SEALED AND MONOLITHIC AND NEGATIVE OUTPUTS AND POSITIVE OUTPUTS

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