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Part Number

Part Number:
NSN:
NIIN:
Item Name:
MICROCIRCUIT , DIGITAL

Definition:

A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".

CAGE Information

Code Company
07263 FAIRCHILD SEMICONDUCTOR CORP

Federal Supply Class

Title

MICROCIRCUITS, ELECTRONIC

Inclusions:

INCLUDES INTEGRATED CIRCUIT DEVICES; INTEGRATED CIRCUIT MODULES, INTEGRATED ELECTRONIC DEVICES: HYBRID, MAGNETIC, MOLECULAR, OPTO-ELECTRONIC, AND THIN FILM.

Exclusions:

EXCLUDES SINGLE CIRCUIT ELEMENTS SUCH AS CAPACITORS; RESISTORS; DIODES AND TRANSISTORS; PRINTED CIRCUIT BOARDS AND CIRCUIT CARD ASSEMBLIES; AND FILTERS AND NETWORKS.

Characteristics (Decoded)

MRC Requirements Statement Clear Text Reply
CQSZ INCLOSURE CONFIGURATION DUAL-IN-LINE
CQSZ INCLOSURE CONFIGURATION DUAL-IN-LINE
ADAU BODY HEIGHT 0.200 INCHES MAXIMUM
AEHX MAXIMUM POWER DISSIPATION RATING 45.0 MILLIWATTS
CBBL FEATURES PROVIDED MONOLITHIC AND POSITIVE OUTPUTS AND COMPLEMENTARY OUTPUTS AND HERMETICALLY SEALED AND RESETTABLE
AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS
CSSL DESIGN FUNCTION AND QUANTITY 1 DECODER, BINARY TO OCTAL
ADAT BODY WIDTH 0.220 INCHES MINIMUM AND 0.280 INCHES MAXIMUM
TTQY TERMINAL TYPE AND QUANTITY 16 PRINTED CIRCUIT
CQSJ INCLOSURE MATERIAL CERAMIC AND GLASS
CQZP INPUT CIRCUIT PATTERN 4 INPUT
CQWX OUTPUT LOGIC FORM TRANSISTOR-TRANSISTOR LOGIC
AFGA OPERATING TEMP RANGE +0.0/+75.0 DEG CELSIUS
CZEN VOLTAGE RATING AND TYPE PER CHARACTERISTIC 4.0 VOLTS MAXIMUM POWER SOURCE
ADAQ BODY LENGTH 0.750 INCHES MINIMUM AND 0.895 INCHES MAXIMUM
CWSG TERMINAL SURFACE TREATMENT SOLDER
TEST TEST DATA DOCUMENT 80009-156-0001 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTING GENERAL TYPE DATA ON CERTAIN ENVIRONMENTAL AND PERFORMANCE REQUIREMENTS AND TEST CONDITIONS THAT ARE SHOWN AS "TYPICAL

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