Part Number
Part Number:
NSN:
NIIN:
Item Name:
TEST SET , SEMICONDUCTOR DEVICE
Definition:
A TEST SET SPECIFICALLY DESIGNED FOR USE IN MAKING EXAMINATIONS OF DIODES, TRANSISTORS, AND THE LIKE. THESE EXAMINATIONS MAY BE EFFECTED IN OR OUT OF CIRCUIT OR BOTH.
CAGE Information
| Code | Company |
|---|---|
| 57705 | HUNTRON INC DBA HUNTRON INSTRUMENTS |
Federal Supply Class
Title
ELECTRICAL AND ELECTRONIC PROPER
Inclusions:
INCLUDES TEST LEADS AND TEST LEAD ATTACHMENTS; TEST INSTRUMENTS DESIGNED FOR COMMUNICATION EQUIPMENT; TEST INSTRUMENTS DESIGNED FOR USE WITH ELECTRONIC EQUIPMENT CLASSIFIED IN TWO OR MORE FSC GROUPS.
Exclusions:
EXCLUDES RADIAC EQUIPMENT
Characteristics (Decoded)
| MRC | Requirements Statement | Clear Text Reply |
|---|---|---|
| FEAT | SPECIAL FEATURES | MAX PROBING AREA: 15.3" X 12.9"; MAX COMPONENT HEIGHT: 2.375"; COMPUTER INTERFACES: RS232 AND PCI BUS |
| ACYN | AC VOLTAGE RATING | 115.0 VOLTS NOMINAL AND 230.0 VOLTS NOMINAL |
| AKWC | ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
| AQXY | TEST TYPE FOR WHICH DESIGNED | AUTOMATED TEST PROBE FOR PRINTED CIRCUIT CARDS |
| ACZB | FREQUENCY RATING | 50.0 HERTZ MINIMUM AND 60.0 HERTZ MAXIMUM |
| CXCY | PART NAME ASSIGNED BY CONTROLLING AGENCY | ACCESS AUTOMATED PROBING STATION |
| FAAZ | PHASE | SINGLE |