Part Number
Part Number:
NSN:
NIIN:
Item Name:
MICROCIRCUIT , LINEAR
Definition:
A MICROCIRCUIT WHOSE OUTPUT IS A FUNCTION OF THE INPUT; THAT IS, THE OUTPUT VARIES IN A PREDETERMINED AND ESSENTIALLY PREDICTABLE MANNER FROM THE INPUT SIGNAL.
CAGE Information
| Code | Company |
|---|---|
| 18324 | PHILIPS SEMICONDUCTORS INC |
Characteristics (Decoded)
| MRC | Requirements Statement | Clear Text Reply |
|---|---|---|
| AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
| CQSJ | INCLOSURE MATERIAL | GLASS AND METAL |
| ADAR | BODY OUTSIDE DIAMETER | 0.355 INCHES MINIMUM AND 0.370 INCHES MAXIMUM |
| AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
| AEHX | MAXIMUM POWER DISSIPATION RATING | 600.0 MILLIWATTS |
| ADAU | BODY HEIGHT | 0.165 INCHES MINIMUM AND 0.185 INCHES MAXIMUM |
| CSSL | DESIGN FUNCTION AND QUANTITY | 1 COMPARATOR, VOLTAGE, DIFFERENTIAL |
| CZEQ | TIME RATING PER CHACTERISTIC | 14.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 16.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
| CQZP | INPUT CIRCUIT PATTERN | 4 INPUT |
| CWSG | TERMINAL SURFACE TREATMENT | TIN |
| AGAV | END ITEM IDENTIFICATION | RECEIVING SET,COUNTERMEASURES TYPE AN/ALR-69(V) |
| TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| CQSZ | INCLOSURE CONFIGURATION | CAN |
| CBBL | FEATURES PROVIDED | MONOLITHIC AND POSITIVE OUTPUTS AND HIGH SPEED AND W/COMPLEMENT AND HERMETICALLY SEALED AND W/STROBE |