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Part Number

Part Number:
NSN:
NIIN:
Item Name:
MICROCIRCUIT , DIGITAL

Definition:

A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".

CAGE Information

Code Company
27014 NATIONAL SEMICONDUCTOR CORPORATION

Federal Supply Class

Title

MICROCIRCUITS, ELECTRONIC

Inclusions:

INCLUDES INTEGRATED CIRCUIT DEVICES; INTEGRATED CIRCUIT MODULES, INTEGRATED ELECTRONIC DEVICES: HYBRID, MAGNETIC, MOLECULAR, OPTO-ELECTRONIC, AND THIN FILM.

Exclusions:

EXCLUDES SINGLE CIRCUIT ELEMENTS SUCH AS CAPACITORS; RESISTORS; DIODES AND TRANSISTORS; PRINTED CIRCUIT BOARDS AND CIRCUIT CARD ASSEMBLIES; AND FILTERS AND NETWORKS.

Characteristics (Decoded)

MRC Requirements Statement Clear Text Reply
CQSZ INCLOSURE CONFIGURATION DUAL-IN-LINE
AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS
CBBL FEATURES PROVIDED SYNCHRONOUS AND PRESETTABLE AND PROGRAMMABLE AND W/CLEAR AND W/CLOCK
CQZP INPUT CIRCUIT PATTERN 9 INPUT
SUPP SUPPLEMENTARY FEATURES 21DEC00 ITEM REVIEWED UNDER GIRDER PROJECT. FG NON-CONCUR CANCELLATION ACTION
AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS
CRHL BIT QUANTITY (NON-CORE) 4
CSSL DESIGN FUNCTION AND QUANTITY 1 COUNTER, BINARY
CQSJ INCLOSURE MATERIAL CERAMIC
ADAQ BODY LENGTH 0.785 INCHES MAXIMUM
CQWX OUTPUT LOGIC FORM TRANSISTOR-TRANSISTOR LOGIC
TEST TEST DATA DOCUMENT 96906-MIL-STD-883 STANDARD
ADAU BODY HEIGHT 0.180 INCHES MAXIMUM
CRTL CRITICALITY CODE JUSTIFICATION FEAT
CZEQ TIME RATING PER CHACTERISTIC 27.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 24.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT
FEAT SPECIAL FEATURES STATIC ELECTRIC SENSITIVE
ADAT BODY WIDTH 0.310 INCHES MAXIMUM

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