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Part Number

Part Number:
NSN:
NIIN:
Item Name:
MICROCIRCUIT , DIGITAL

Definition:

A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".

CAGE Information

Code Company
C7191 ADELCO ELEKTRONIK GMBH

Federal Supply Class

Title

MICROCIRCUITS, ELECTRONIC

Inclusions:

INCLUDES INTEGRATED CIRCUIT DEVICES; INTEGRATED CIRCUIT MODULES, INTEGRATED ELECTRONIC DEVICES: HYBRID, MAGNETIC, MOLECULAR, OPTO-ELECTRONIC, AND THIN FILM.

Exclusions:

EXCLUDES SINGLE CIRCUIT ELEMENTS SUCH AS CAPACITORS; RESISTORS; DIODES AND TRANSISTORS; PRINTED CIRCUIT BOARDS AND CIRCUIT CARD ASSEMBLIES; AND FILTERS AND NETWORKS.

Characteristics (Decoded)

MRC Requirements Statement Clear Text Reply
CQSZ INCLOSURE CONFIGURATION DUAL-IN-LINE
CZEQ TIME RATING PER CHACTERISTIC 15.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 22.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT
AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS
CBBL FEATURES PROVIDED HERMETICALLY SEALED AND W/TOTEM POLE OUTPUT AND MONOLITHIC
CSSL DESIGN FUNCTION AND QUANTITY 4 GATE, OR
AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS
AEHX MAXIMUM POWER DISSIPATION RATING 96.0 MILLIWATTS
ADAQ BODY LENGTH 0.785 INCHES MAXIMUM
CQSJ INCLOSURE MATERIAL CERAMIC AND GLASS
CQWX OUTPUT LOGIC FORM TRANSISTOR-TRANSISTOR LOGIC
TEST TEST DATA DOCUMENT 96906-MIL-STD-883 STANDARD
CQZP INPUT CIRCUIT PATTERN QUAD 2 INPUT
ADAU BODY HEIGHT 0.160 INCHES MAXIMUM
ADAT BODY WIDTH 0.310 INCHES MAXIMUM

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