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Part Number

Part Number:
NSN:
NIIN:
Item Name:
MICROCIRCUIT , DIGITAL

Definition:

A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".

CAGE Information

Code Company
27014 NATIONAL SEMICONDUCTOR CORPORATION

Characteristics (Decoded)

MRC Requirements Statement Clear Text Reply
CQSZ INCLOSURE CONFIGURATION DUAL-IN-LINE
AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS
CQZP INPUT CIRCUIT PATTERN QUAD 3-2-3-2 INPUT
CZEQ TIME RATING PER CHACTERISTIC 22.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 27.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT
ADAQ BODY LENGTH 0.755 INCHES MINIMUM AND 0.785 INCHES MAXIMUM
CSSL DESIGN FUNCTION AND QUANTITY 4 LATCH, NAND, R/S
AEHX MAXIMUM POWER DISSIPATION RATING 90.0 MILLIWATTS
ADAU BODY HEIGHT 0.140 INCHES MINIMUM AND 0.180 INCHES MAXIMUM
CBBL FEATURES PROVIDED POSITIVE OUTPUTS AND HERMETICALLY SEALED AND MONOLITHIC AND LOW POWER AND SCHOTTKY AND RESETTABLE AND W/TOTEM POLE OUTPUT
AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS
CZEN VOLTAGE RATING AND TYPE PER CHARACTERISTIC 5.5 VOLTS MAXIMUM POWER SOURCE
ADAT BODY WIDTH 0.290 INCHES MINIMUM AND 0.310 INCHES MAXIMUM
TTQY TERMINAL TYPE AND QUANTITY 16 PRINTED CIRCUIT
CQSJ INCLOSURE MATERIAL CERAMIC AND GLASS
CQWX OUTPUT LOGIC FORM TRANSISTOR-TRANSISTOR LOGIC
TEST TEST DATA DOCUMENT 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.).
CWSG TERMINAL SURFACE TREATMENT SOLDER

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