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Part Number

Part Number:
NSN:
NIIN:
Item Name:
MICROCIRCUIT , LINEAR

Definition:

A MICROCIRCUIT WHOSE OUTPUT IS A FUNCTION OF THE INPUT; THAT IS, THE OUTPUT VARIES IN A PREDETERMINED AND ESSENTIALLY PREDICTABLE MANNER FROM THE INPUT SIGNAL.

CAGE Information

Code Company
27014 NATIONAL SEMICONDUCTOR CORPORATION

Federal Supply Class

Title

MICROCIRCUITS, ELECTRONIC

Inclusions:

INCLUDES INTEGRATED CIRCUIT DEVICES; INTEGRATED CIRCUIT MODULES, INTEGRATED ELECTRONIC DEVICES: HYBRID, MAGNETIC, MOLECULAR, OPTO-ELECTRONIC, AND THIN FILM.

Exclusions:

EXCLUDES SINGLE CIRCUIT ELEMENTS SUCH AS CAPACITORS; RESISTORS; DIODES AND TRANSISTORS; PRINTED CIRCUIT BOARDS AND CIRCUIT CARD ASSEMBLIES; AND FILTERS AND NETWORKS.

Characteristics (Decoded)

MRC Requirements Statement Clear Text Reply
CQSZ INCLOSURE CONFIGURATION DUAL-IN-LINE
AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS
ADAT BODY WIDTH 0.245 INCHES MINIMUM AND 0.271 INCHES MAXIMUM
ADAQ BODY LENGTH 0.750 INCHES MINIMUM AND 0.785 INCHES MAXIMUM
AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS
AEHX MAXIMUM POWER DISSIPATION RATING 800.0 MILLIWATTS
CSSL DESIGN FUNCTION AND QUANTITY 3 RECEIVER, LINE
CQSJ INCLOSURE MATERIAL CERAMIC
CQZP INPUT CIRCUIT PATTERN TRIPLE 4-3-4 INPUT
CWSG TERMINAL SURFACE TREATMENT TIN
CZEQ TIME RATING PER CHACTERISTIC 30.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 30.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT
TEST TEST DATA DOCUMENT 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.).
AGAV END ITEM IDENTIFICATION AN/WLQ-4(V) 07397
ADAU BODY HEIGHT 0.185 INCHES MAXIMUM
CBBL FEATURES PROVIDED BURN IN, MIL-STD-883, CLASS B AND HERMETICALLY SEALED AND HIGH SPEED AND W/STROBE

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