Part Number
Part Number:
NSN:
NIIN:
Item Name:
TEST SET , SEMICONDUCTOR DEVICE
Definition:
A TEST SET SPECIFICALLY DESIGNED FOR USE IN MAKING EXAMINATIONS OF DIODES, TRANSISTORS, AND THE LIKE. THESE EXAMINATIONS MAY BE EFFECTED IN OR OUT OF CIRCUIT OR BOTH.
CAGE Information
| Code | Company |
|---|---|
| 21825 | DYNATRAN ELECTRONIC CO |
Characteristics (Decoded)
| MRC | Requirements Statement | Clear Text Reply |
|---|---|---|
| ANPZ | INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| ACYN | AC VOLTAGE RATING | 105.0 VOLTS MINIMUM AND 125.0 VOLTS MAXIMUM |
| ZZZV | FSC APPLICATION DATA | DIODE SEMICONDUCTOR DEVICES TEST SETS,EXCEPT SPECIALLY DESIGNED |
| AQXZ | OPERATING TEST CAPABILITY | FORWARD VOLTAGE 0 TO 20V FORWARD CURRENT 0 TO 500 MA REVERSE VOLTAGE 0 TO 300V REVERSE CURRENT 0 TO 5MA |
| HGTH | HEIGHT | 9.250 INCHES NOMINAL |
| ALSF | INTERNAL BATTERY ACCOMMODATION | NOT INCLUDED |
| ABRY | LENGTH | 8.000 INCHES NOMINAL |
| ABGL | WIDTH | 111.500 INCHES NOMINAL |
| ACZB | FREQUENCY RATING | 50.0 HERTZ MINIMUM AND 60.0 HERTZ MAXIMUM |
| ANNQ | MATERIAL AND LOCATION | STEEL HOUSING |
| AQXY | TEST TYPE FOR WHICH DESIGNED | MEASUREMENT OF STATIC CHARACTERISTICS OF MEDIUM AND LOWER POWER DIODES |
| FAAZ | PHASE | SINGLE |