Part Number
Part Number:
NSN:
NIIN:
Item Name:
MICROCIRCUIT , DIGITAL
Definition:
A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".
CAGE Information
Code | Company |
---|---|
34371 | INTERSIL CORPORATION |
Characteristics (Decoded)
MRC | Requirements Statement | Clear Text Reply |
---|---|---|
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
ADAU | BODY HEIGHT | 0.200 INCHES MAXIMUM |
CZEQ | TIME RATING PER CHACTERISTIC | 300.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 300.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
AEHX | MAXIMUM POWER DISSIPATION RATING | 500.0 MILLIWATTS |
CBBL | FEATURES PROVIDED | W/CLEAR AND W/CLOCK AND HERMETICALLY SEALED |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
ADAQ | BODY LENGTH | 0.785 INCHES MAXIMUM |
CQZP | INPUT CIRCUIT PATTERN | DUAL 4 INPUT |
CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
CSSL | DESIGN FUNCTION AND QUANTITY | 2 FLIP-FLOP, J-K |
TEST | TEST DATA DOCUMENT | 30377-20264 DRAWING |
ADAT | BODY WIDTH | 0.300 INCHES MAXIMUM |