Part Number
Part Number:
NSN:
NIIN:
Item Name:
MICROCIRCUIT , DIGITAL
Definition:
A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".
CAGE Information
Code | Company |
---|---|
34371 | INTERSIL CORPORATION |
Characteristics (Decoded)
MRC | Requirements Statement | Clear Text Reply |
---|---|---|
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
CTQX | CURRENT RATING PER CHARACTERISTIC | 1.00 MICROAMPERES FORWARD CURRENT, NONREPETITIVE, MAXIMUM PEAK TOTAL VALUE MICROAMPERES |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD883 STANDARD |
CXCY | PART NAME ASSIGNED BY CONTROLLING AGENCY | MICROCIRCUIT, DIGITAL, STANDARD CELL, 1553 SERIAL DIGITAL INTERFACE (SDI), MONOLITHIC SILICON |
AGAV | END ITEM IDENTIFICATION | PACER DAWN |
CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | CMAGA3-+84 JOINT ELECTRON DEVICE ENGINEERING COUNCIL |
CRTL | CRITICALITY CODE JUSTIFICATION | CBBL |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -0.5 VOLTS MINIMUM TOTAL SUPPLY AND 7.0 VOLTS MAXIMUM TOTAL SUPPLY |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
CBBL | FEATURES PROVIDED | MONOLITHIC AND ELECTROSTATIC SENSITIVE AND TESTED TO MIL-STD-883 AND BURN IN |
CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
CQSZ | INCLOSURE CONFIGURATION | PIN GRID ARRAY |
CSSL | DESIGN FUNCTION AND QUANTITY | 1 CONTROL, INTERFACE |
TTQY | TERMINAL TYPE AND QUANTITY | 84 PIN |
FEAT | SPECIAL FEATURES | TERMINAL FINISH GOLD PLATING 60 MICRO INCHES MIN THICKNESS OVER 100 MICRO INCHES (NONRECOVERABLE) |