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Part Number

Part Number:
NSN:
NIIN:
Item Name:
MICROCIRCUIT , DIGITAL

Definition:

A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".

CAGE Information

Code Company
61772 INTEGRATED DEVICE TECHNOLOGY INC

Federal Supply Class

Title

MICROCIRCUITS, ELECTRONIC

Inclusions:

INCLUDES INTEGRATED CIRCUIT DEVICES; INTEGRATED CIRCUIT MODULES, INTEGRATED ELECTRONIC DEVICES: HYBRID, MAGNETIC, MOLECULAR, OPTO-ELECTRONIC, AND THIN FILM.

Exclusions:

EXCLUDES SINGLE CIRCUIT ELEMENTS SUCH AS CAPACITORS; RESISTORS; DIODES AND TRANSISTORS; PRINTED CIRCUIT BOARDS AND CIRCUIT CARD ASSEMBLIES; AND FILTERS AND NETWORKS.

Characteristics (Decoded)

MRC Requirements Statement Clear Text Reply
AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS
CZEN VOLTAGE RATING AND TYPE PER CHARACTERISTIC -0.5 VOLTS MINIMUM INPUT AND 7.0 VOLTS MAXIMUM INPUT
AEHX MAXIMUM POWER DISSIPATION RATING 500.0 MILLIWATTS
AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS
CXCY PART NAME ASSIGNED BY CONTROLLING AGENCY MICROCIRCUIT, DIGITAL, FAST CMOS OCTAL BUFFER/LINE DRIVER WITH INVERTING THREE STATE OUTPUTS, TTL COMPATIBLE INPUTS, LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON
CSSL DESIGN FUNCTION AND QUANTITY 8 BUFFER
CQWX OUTPUT LOGIC FORM COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC
TEST TEST DATA DOCUMENT 96906-MIL-STD-883 STANDARD
AGAV END ITEM IDENTIFICATION RSIP, CAGE 67268
CQSZ INCLOSURE CONFIGURATION LEADLESS FLAT PACK
TTQY TERMINAL TYPE AND QUANTITY 20 LEADLESS
CWSG TERMINAL SURFACE TREATMENT SOLDER

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