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Part Number

Part Number:
NSN:
NIIN:
Item Name:
MICROCIRCUIT , DIGITAL

Definition:

A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".

CAGE Information

Code Company
61772 INTEGRATED DEVICE TECHNOLOGY INC

Federal Supply Class

Title

MICROCIRCUITS, ELECTRONIC

Inclusions:

INCLUDES INTEGRATED CIRCUIT DEVICES; INTEGRATED CIRCUIT MODULES, INTEGRATED ELECTRONIC DEVICES: HYBRID, MAGNETIC, MOLECULAR, OPTO-ELECTRONIC, AND THIN FILM.

Exclusions:

EXCLUDES SINGLE CIRCUIT ELEMENTS SUCH AS CAPACITORS; RESISTORS; DIODES AND TRANSISTORS; PRINTED CIRCUIT BOARDS AND CIRCUIT CARD ASSEMBLIES; AND FILTERS AND NETWORKS.

Characteristics (Decoded)

MRC Requirements Statement Clear Text Reply
AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS
CXCY PART NAME ASSIGNED BY CONTROLLING AGENCY MICROCIRCUITS, MEMORY, DIGITAL, CMOS 2K X 16 DUAL PORT SRAM, MONOLITHIC SILICON
CZEN VOLTAGE RATING AND TYPE PER CHARACTERISTIC -0.5 VOLTS MINIMUM INPUT AND 7.0 VOLTS MAXIMUM INPUT
TTQY TERMINAL TYPE AND QUANTITY 68 PIN
AEHX MAXIMUM POWER DISSIPATION RATING 2.0 WATTS
AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS
CSSL DESIGN FUNCTION AND QUANTITY 1 MEMORY, STATIC RAM
FEAT SPECIAL FEATURES ACCESS TIME - 35 NS
CQWX OUTPUT LOGIC FORM COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC
TEST TEST DATA DOCUMENT 96906-MIL-STD-883 STANDARD
CQSZ INCLOSURE CONFIGURATION PIN GRID ARRAY
AGAV END ITEM IDENTIFICATION 2320-01-123-1610
CWSG TERMINAL SURFACE TREATMENT SOLDER
CBBL FEATURES PROVIDED MONOLITHIC

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