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Part Number

Part Number:
NSN:
NIIN:
Item Name:
MICROCIRCUIT , MEMORY

Definition:

A CIRCUIT DESIGNED TO STORE INFORMATION AND/OR CODED INSTRUCTIONS FOR LATER USE. ITEM HAS PINS OR OTHER CONNECTIONS TO INSTALL IN A COMPUTER OR COMPUTING DEVICE. DOES NOT INCLUDE MAGNETIC DRUMS, TAPES, PUNCHED CARDS OR THE LIKE. FOR ITEMS THAT HAVE PORTABLE TYPE CONNECTIONS SEE MEMORY, PORTABLE, SOLID STATE.

CAGE Information

Code Company
60911 SGS-THOMSON MICROELECTRONICS INC

Federal Supply Class

Title

MICROCIRCUITS, ELECTRONIC

Inclusions:

INCLUDES INTEGRATED CIRCUIT DEVICES; INTEGRATED CIRCUIT MODULES, INTEGRATED ELECTRONIC DEVICES: HYBRID, MAGNETIC, MOLECULAR, OPTO-ELECTRONIC, AND THIN FILM.

Exclusions:

EXCLUDES SINGLE CIRCUIT ELEMENTS SUCH AS CAPACITORS; RESISTORS; DIODES AND TRANSISTORS; PRINTED CIRCUIT BOARDS AND CIRCUIT CARD ASSEMBLIES; AND FILTERS AND NETWORKS.

Characteristics (Decoded)

MRC Requirements Statement Clear Text Reply
CBBL FEATURES PROVIDED MONOLITHIC AND ELECTROSTATIC SENSITIVE
AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS
ADAQ BODY LENGTH 0.496 INCHES MAXIMUM
AEHX MAXIMUM POWER DISSIPATION RATING 1.0 WATTS
TTQY TERMINAL TYPE AND QUANTITY 22 LEADLESS
AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS
CQSJ INCLOSURE MATERIAL CERAMIC
CZEN VOLTAGE RATING AND TYPE PER CHARACTERISTIC 7.0 VOLTS MAXIMUM POWER SOURCE
CRHL BIT QUANTITY (NON-CORE) 256
CQWX OUTPUT LOGIC FORM COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC
TEST TEST DATA DOCUMENT 96906-MIL-STD-883 STANDARD
CQSZ INCLOSURE CONFIGURATION LEADLESS FLAT PACK
CZER MEMORY DEVICE TYPE RAM
ADAT BODY WIDTH 0.296 INCHES MAXIMUM
ADAU BODY HEIGHT 0.080 INCHES MAXIMUM
CQZP INPUT CIRCUIT PATTERN 10 INPUT
CWSG TERMINAL SURFACE TREATMENT SOLDER
CSWJ WORD QUANTITY (NON-CORE) 256

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