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Part Number

Part Number:
NSN:
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Item Name:
MICROCIRCUIT , DIGITAL

Definition:

A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".

CAGE Information

Code Company
34649 INTEL CORP SALES OFFICE

Federal Supply Class

Title

MICROCIRCUITS, ELECTRONIC

Inclusions:

INCLUDES INTEGRATED CIRCUIT DEVICES; INTEGRATED CIRCUIT MODULES, INTEGRATED ELECTRONIC DEVICES: HYBRID, MAGNETIC, MOLECULAR, OPTO-ELECTRONIC, AND THIN FILM.

Exclusions:

EXCLUDES SINGLE CIRCUIT ELEMENTS SUCH AS CAPACITORS; RESISTORS; DIODES AND TRANSISTORS; PRINTED CIRCUIT BOARDS AND CIRCUIT CARD ASSEMBLIES; AND FILTERS AND NETWORKS.

Characteristics (Decoded)

MRC Requirements Statement Clear Text Reply
CQSZ INCLOSURE CONFIGURATION DUAL-IN-LINE
ADAQ BODY LENGTH 2.096 INCHES MAXIMUM
AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS
ADAT BODY WIDTH 0.620 INCHES MAXIMUM
ADAU BODY HEIGHT 0.225 INCHES MAXIMUM
CBBL FEATURES PROVIDED BURN IN AND HERMETICALLY SEALED AND W/CLOCK AND ELECTROSTATIC SENSITIVE AND W/RESET
CSSL DESIGN FUNCTION AND QUANTITY 1 CONTROL
CQZP INPUT CIRCUIT PATTERN 28 INPUT
AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS
CQSJ INCLOSURE MATERIAL CERAMIC
CZEN VOLTAGE RATING AND TYPE PER CHARACTERISTIC 7.0 VOLTS MAXIMUM POWER SOURCE
TEST TEST DATA DOCUMENT 96906-MIL-STD-883 STANDARD
CQWX OUTPUT LOGIC FORM METAL OXIDE-SEMICONDUCTOR LOGIC
CZEQ TIME RATING PER CHACTERISTIC 2000.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 2000.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT
TTQY TERMINAL TYPE AND QUANTITY 40 PRINTED CIRCUIT
CWSG TERMINAL SURFACE TREATMENT SOLDER

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