Part Number
Part Number:
NSN:
NIIN:
Item Name:
TEST SET , SEMICONDUCTOR DEVICE
Definition:
A TEST SET SPECIFICALLY DESIGNED FOR USE IN MAKING EXAMINATIONS OF DIODES, TRANSISTORS, AND THE LIKE. THESE EXAMINATIONS MAY BE EFFECTED IN OR OUT OF CIRCUIT OR BOTH.
CAGE Information
| Code | Company |
|---|---|
| 05234 | THERMO JARRELL ASH CORP BAIRD DIV |
Federal Supply Class
Title
ELECTRICAL AND ELECTRONIC PROPER
Inclusions:
INCLUDES TEST LEADS AND TEST LEAD ATTACHMENTS; TEST INSTRUMENTS DESIGNED FOR COMMUNICATION EQUIPMENT; TEST INSTRUMENTS DESIGNED FOR USE WITH ELECTRONIC EQUIPMENT CLASSIFIED IN TWO OR MORE FSC GROUPS.
Exclusions:
EXCLUDES RADIAC EQUIPMENT
Characteristics (Decoded)
| MRC | Requirements Statement | Clear Text Reply |
|---|---|---|
| ANPZ | INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| FCLS | FUNCTIONAL CLASSIFICATION | AA-9.3 |
| SUPP | SUPPLEMENTARY FEATURES | MANUFACTURERS NAME: TRANSISTOR TEST SET |
| AQXY | TEST TYPE FOR WHICH DESIGNED | GO/NO GO TEST IN OR OUT OF CIRCUIT TEST FOR ALL TRANSISTORS & FET'S |
| CXCY | PART NAME ASSIGNED BY CONTROLLING AGENCY | TEST SE SEMICONDUCTIVE DEVICE ALSO CALLED PORTABLE SUPER CRICKET |
| FEAT | SPECIAL FEATURES | ALSO CALLED PORTABLE SUPER CRICKET; NO SET-UP REQUIRED, CONNECT TEST LEADS IN ANY ORDER, ROTATE TEST SWITCH, IF DEVICE IS GOOD, HEAR A CHIRP; PUSH BUTTON FOR GAIN, HELPFUL IN TROUBLESHOOTING AS WELL AS MATCHING TRANSISTORS & FET'S; ORDER PROBE 39G85 SEPARATELY FOR TESTING PC BOARDS |