Part Number
Part Number:
NSN:
NIIN:
Item Name:
TEST SET , SEMICONDUCTOR DEVICE
Definition:
A TEST SET SPECIFICALLY DESIGNED FOR USE IN MAKING EXAMINATIONS OF DIODES, TRANSISTORS, AND THE LIKE. THESE EXAMINATIONS MAY BE EFFECTED IN OR OUT OF CIRCUIT OR BOTH.
CAGE Information
| Code | Company |
|---|---|
| 44D86 | WAVETEK METERMAN TEST TOOLS |
Characteristics (Decoded)
| MRC | Requirements Statement | Clear Text Reply |
|---|---|---|
| ABRY | LENGTH | 183.0 MILLIMETERS NOMINAL |
| AEJZ | DEPTH | 79.0 MILLIMETERS NOMINAL |
| ABGL | WIDTH | 38.0 MILLIMETERS NOMINAL |
| AQXY | TEST TYPE FOR WHICH DESIGNED | INDUCTANCE, COAPACITANCE, RESISTANCE, TRANSISTORS, DIODES |