Part Number
Part Number:
NSN:
NIIN:
Item Name:
MICROCIRCUIT , DIGITAL
Definition:
A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".
CAGE Information
| Code | Company |
|---|---|
| 01295 | TEXAS INSTRUMENTS INCORPORATED DBA T |
Federal Supply Class
Title
MICROCIRCUITS, ELECTRONIC
Inclusions:
INCLUDES INTEGRATED CIRCUIT DEVICES; INTEGRATED CIRCUIT MODULES, INTEGRATED ELECTRONIC DEVICES: HYBRID, MAGNETIC, MOLECULAR, OPTO-ELECTRONIC, AND THIN FILM.
Exclusions:
EXCLUDES SINGLE CIRCUIT ELEMENTS SUCH AS CAPACITORS; RESISTORS; DIODES AND TRANSISTORS; PRINTED CIRCUIT BOARDS AND CIRCUIT CARD ASSEMBLIES; AND FILTERS AND NETWORKS.
Characteristics (Decoded)
| MRC | Requirements Statement | Clear Text Reply |
|---|---|---|
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | SOIC8 JOINT ELECTRON DEVICE ENGINEERING COUNCIL |
| CBBL | FEATURES PROVIDED | HIGH SPEED AND W/STROBE |
| TTQY | TERMINAL TYPE AND QUANTITY | 8 GULLWING |
| AEHX | MAXIMUM POWER DISSIPATION RATING | 500.0 MILLIWATTS |
| TEST | TEST DATA DOCUMENT | 89954-356A1407 SPECIFICATION |
| AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
| CSSL | DESIGN FUNCTION AND QUANTITY | 1 COMPARATOR, VOLTAGE |
| AFGA | OPERATING TEMP RANGE | -40.0/+85.0 DEG CELSIUS |
| CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC AND METAL OXIDE-SEMICONDUCTOR LOGIC |
| CXCY | PART NAME ASSIGNED BY CONTROLLING AGENCY | MICROCIRCUIT, LINEAR, PLASTIC ENCAPSULATED, SURFACE MOUNT - PROCUREMENT AND SELECTION REQUIREMENTS |
| CQSJ | INCLOSURE MATERIAL | PLASTIC |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -18.0 VOLTS MINIMUM INPUT AND 18.0 VOLTS MAXIMUM INPUT |
| SPCL | SPECIAL TEST FEATURES | DIFFERENTIAL VOLTAGE COMPARATOR IS 100 PERCENT UPSCREENED PER PARA.3.1.1 OF BAE DWG 89954-356A1407 BY AN APPROVED TEST FACILITY FOR OPERATION IN TEMPERATURES OF -55C THROUGH +125C. |