Part Number
Part Number:
NSN:
NIIN:
Item Name:
MICROCIRCUIT , DIGITAL
Definition:
A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".
CAGE Information
Code | Company |
---|---|
16236 | DLA LAND AND MARITIME |
Federal Supply Class
Title
MICROCIRCUITS, ELECTRONIC
Inclusions:
INCLUDES INTEGRATED CIRCUIT DEVICES; INTEGRATED CIRCUIT MODULES, INTEGRATED ELECTRONIC DEVICES: HYBRID, MAGNETIC, MOLECULAR, OPTO-ELECTRONIC, AND THIN FILM.
Exclusions:
EXCLUDES SINGLE CIRCUIT ELEMENTS SUCH AS CAPACITORS; RESISTORS; DIODES AND TRANSISTORS; PRINTED CIRCUIT BOARDS AND CIRCUIT CARD ASSEMBLIES; AND FILTERS AND NETWORKS.
Characteristics (Decoded)
MRC | Requirements Statement | Clear Text Reply |
---|---|---|
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
ADAT | BODY WIDTH | 0.260 INCHES MAXIMUM |
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
FEAT | SPECIAL FEATURES | ITEM MUST COMPLY WITH REQUIREMENTS OF DEFENSE SUPPLY CENTER COLUMBUS PRODUCTION STANDARD LO3851 |
CRTL | CRITICALITY CODE JUSTIFICATION | ZZZY |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 20.0 VOLTS MAXIMUM POWER SOURCE |
TTQY | TERMINAL TYPE AND QUANTITY | 14 PRINTED CIRCUIT |
CZEQ | TIME RATING PER CHACTERISTIC | 600.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 600.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
AEHX | MAXIMUM POWER DISSIPATION RATING | 500.0 MILLIWATTS |
AGAV | END ITEM IDENTIFICATION | AIRCRAFT, VIKING S-3B; AIRCRAFT, HAWKEYE E-2C; TA-4J AIRCRAFT; AIRCRAFT, HARRIER AV-8B; AIRCRAFT, B-2 BOMBER (ATB); AIRCRAFT, HERCULES C-130; AIRCRAFT, HORNET F/A-18; AIRCRAFT, GALAXY C-5; NUCLEAR POWER PLANTS |
ZZZY | REFERENCE NUMBER DIFFERENTIATING CHARACTERISTICS | REFERENCE NUMBER DIFFERENTIATING MATERIAL WILL BE IN ACCORDANCE WITH NAVAL INVENTORY CONTROL POINT ACTIVITY HX QUALITY CONTROL. MANUFACTURING AND TESTING SPECIFICATIONS AVAILABLE AT THE DLA ICP |
CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | MO-001AB JOINT ELECTRON DEVICE ENGINEERING COUNCIL |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND BURN IN AND HIGH VOLTAGE AND ELECTROSTATIC SENSITIVE |
CQZP | INPUT CIRCUIT PATTERN | QUAD 2 INPUT |
ADAU | BODY HEIGHT | 0.180 INCHES MAXIMUM |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
ADAQ | BODY LENGTH | 0.770 INCHES MAXIMUM |
CSSL | DESIGN FUNCTION AND QUANTITY | 4 SCHMITT TRIGGER |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |