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Part Number

Part Number:
NSN:
NIIN:
Item Name:
TEST SET , SEMICONDUCTOR DEVICE

Definition:

A TEST SET SPECIFICALLY DESIGNED FOR USE IN MAKING EXAMINATIONS OF DIODES, TRANSISTORS, AND THE LIKE. THESE EXAMINATIONS MAY BE EFFECTED IN OR OUT OF CIRCUIT OR BOTH.

CAGE Information

Code Company
1LQK8 AGILENT TECHNOLOGIES INC. DIV AGILEN

Federal Supply Class

Title

ELECTRICAL AND ELECTRONIC PROPER

Inclusions:

INCLUDES TEST LEADS AND TEST LEAD ATTACHMENTS; TEST INSTRUMENTS DESIGNED FOR COMMUNICATION EQUIPMENT; TEST INSTRUMENTS DESIGNED FOR USE WITH ELECTRONIC EQUIPMENT CLASSIFIED IN TWO OR MORE FSC GROUPS.

Exclusions:

EXCLUDES RADIAC EQUIPMENT

Characteristics (Decoded)

MRC Requirements Statement Clear Text Reply
ZZZV FSC APPLICATION DATA TEST SETS,ELECTRONIC SYSTEMS,EXCEPT SPECIALLY DESIGNED

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