Part Number
Part Number:
NSN:
NIIN:
Item Name:
PROBE , TEST
Definition:
AN ITEM WHICH IS DESIGNED TO BE ATTACHED TO BUT DOES NOT INCLUDE A WIRE OR CABLE. IT IS USED IN THE TESTING OF ELECTRIC OR ELECTRONIC CIRCUITS. ELECTRONIC COMPONENTS SUCH AS CAPACITORS, ELECTRON TUBE, RESISTORS, SEMICONDUCTOR DEVICES AND THE LIKE ARE MOUNTED INTO AND INCLUDED WITH THE ITEM. EXCLUDES PROBE-LEAD ASSEMBLY, TEST AND TEST PROBE ATTACHMENT. SEE ALSO, PROD, TEST.
CAGE Information
| Code | Company |
|---|---|
| 80009 | TEKTRONIX INC. DBA TEKTRONIX |
Characteristics (Decoded)
| MRC | Requirements Statement | Clear Text Reply |
|---|---|---|
| FEAT | SPECIAL FEATURES | CAPABLE OF MEASURING FLOATING VOLTAGES UP TO 5600 VOLTS DC; BANDWIDTH UP TO 50 MEGAHERTZ; PART NAME ASSIGNED BY MANUFACTURER DIFFERENTIAL PROBE |
| ARET | CONDUCTOR ATTACHMENT METHOD | CABLE ATTACHES BY MEANS OF RECEPTACLE |
| APBT | CIRCUIT TYPE | HIGH VOLTAGE |
| ARES | TIP TERMINATION TYPE | PROBE AND BANANA STANDARD |