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Part Number

Part Number:
NSN:
NIIN:
Item Name:
MICROCIRCUIT , DIGITAL

Definition:

A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".

CAGE Information

Code Company
65786 CYPRESS SEMICONDUCTOR CORPORATION

Federal Supply Class

Title

MICROCIRCUITS, ELECTRONIC

Inclusions:

INCLUDES INTEGRATED CIRCUIT DEVICES; INTEGRATED CIRCUIT MODULES, INTEGRATED ELECTRONIC DEVICES: HYBRID, MAGNETIC, MOLECULAR, OPTO-ELECTRONIC, AND THIN FILM.

Exclusions:

EXCLUDES SINGLE CIRCUIT ELEMENTS SUCH AS CAPACITORS; RESISTORS; DIODES AND TRANSISTORS; PRINTED CIRCUIT BOARDS AND CIRCUIT CARD ASSEMBLIES; AND FILTERS AND NETWORKS.

Characteristics (Decoded)

MRC Requirements Statement Clear Text Reply
ABHP OVERALL LENGTH 1.280 INCHES MAXIMUM
CQSZ INCLOSURE CONFIGURATION DUAL-IN-LINE
AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS
TTQY TERMINAL TYPE AND QUANTITY 24 PRINTED CIRCUIT
AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS
CTFT CASE OUTLINE SOURCE AND DESIGNATOR D-9 MIL-M-38510
CQSJ INCLOSURE MATERIAL CERAMIC
ABMK OVERALL WIDTH 0.320 INCHES MAXIMUM
CZEN VOLTAGE RATING AND TYPE PER CHARACTERISTIC 7.0 VOLTS MAXIMUM POWER SOURCE
AEHX MAXIMUM POWER DISSIPATION RATING 1.2 WATTS
CQWX OUTPUT LOGIC FORM COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC
TEST TEST DATA DOCUMENT 96906-MIL-STD-883 STANDARD
CSSL DESIGN FUNCTION AND QUANTITY 1 ARRAY, LOGIC
ABKW OVERALL HEIGHT 0.400 INCHES MAXIMUM
CQZP INPUT CIRCUIT PATTERN 22 INPUT
ADAQ BODY LENGTH 1.280 INCHES MAXIMUM
ADAU BODY HEIGHT 0.185 INCHES MAXIMUM
CWSG TERMINAL SURFACE TREATMENT SOLDER
CBBL FEATURES PROVIDED MONOLITHIC AND BURN IN AND PROGRAMMED
ADAT BODY WIDTH 0.310 INCHES MAXIMUM

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