Part Number
Part Number:
NSN:
NIIN:
Item Name:
TEST STATION , ELECTRICAL-ELECTRON
Definition:
A GROUP OF ITEMS INCLUDING A CONSOLE AND PERIPHERAL EQUIPMENT SPECIFICALLY DESIGNED FOR USE IN TESTING ELECTRICAL-ELECTRONIC EQUIPMENT. MAY INCLUDE SELF-TEST CAPABILITIES. SEE TEST STATION, GUIDED MISSILE; FAULT LOCATOR (AS MODIFIED)
CAGE Information
| Code | Company |
|---|---|
| 0DRX9 | ADVANCED TESTING TECHNOLOGIES INC DB |
Federal Supply Class
Title
ELECTRICAL AND ELECTRONIC PROPER
Inclusions:
INCLUDES TEST LEADS AND TEST LEAD ATTACHMENTS; TEST INSTRUMENTS DESIGNED FOR COMMUNICATION EQUIPMENT; TEST INSTRUMENTS DESIGNED FOR USE WITH ELECTRONIC EQUIPMENT CLASSIFIED IN TWO OR MORE FSC GROUPS.
Exclusions:
EXCLUDES RADIAC EQUIPMENT
Characteristics (Decoded)
| MRC | Requirements Statement | Clear Text Reply |
|---|---|---|
| FEAT | SPECIAL FEATURES | 5REQUESTED NAME TEST SET,RF;OPT 02 IS DYNAMIC DIGITAL;OPT 03 ELECTRONIC LOAD AND KIT;OPT 04 INTERNAL AMP, MODULAR SIGNAL GENERATOR 1 HZ RESOLUTION UPGRADE;OPT 05 MICROWAVE ANALYZER AND RF SIGNAL PROCESSOR/MATRIX;OPT 06 TRANSPORTABLE ANALYZER CASE |
| AJKC | SUPPLY ITEMS AND QUANTITIES | MAINFRAME SERIES C STARTER SYSTEM 2;64 CHANNEL RELAY MULTIPLEXER 3;RF MULTIPLEXER 2;6.5 DIGIT MULTIMETER 1;HIGH PERFORMANCE UNIVERSAL COUNTER 1;ARBITRARY FUNCTION GENERATOR 1;21 MHZ SYSTHESIZED FUNCTION/SWEEP GENERATOR 1;DIGITAL FUNCTION TEST 1;DYNAMIC DIGITAL 4;QUAD 8-BIT LATCH 1;RELAY MATRIX 1;1-GSAS DIGITIZING OSCOPE 1;32 CHANNEL 5 AMP FORM C SWITCH 1;SYNCHRO/RESOLVER SIMULATOR 1;BUS ANALYZER SIMULATOR 1;INTEL BASED PC 1;AC POWER SUPPLY 1;DC POWER SUPPLY 2;MODULES FOR DC POWER SUPPLY 8;RF RACK 1;RFIU MODULES 3;IEEE SIGNAL GENERATOR 1;FREQ EXTENSION MODULE 1 |
| AGAV | END ITEM IDENTIFICATION | ARC-229 FOR THE E-3B/C |
| RDAL | REFERENCE DATA AND LITERATURE | SERD0048 |